192 The following brief memorials note the recent passing of two renowned scientists in our field. Dr. Allen Robert “Bob”Waugh (1950–2016)
Dr. Bob Waugh was one of the world’s top electron optical engineers, and developed the first commercial focused ion beam (FIB), which is now used in laboratories worldwide for transmission electron microscopy (TEM) specimen preparation and surface chemical analysis. Bob Waugh obtained his first
degree in Natural Sciences at the University of Cambridge and went on to a PhD in the Department of Materials Science and Metallurgy, in the Field Ion Microscopy (FIM) group. Waugh turned out to be a master at ion-optical design and built atom probes that were capable of imaging atoms and deter- mining their elemental identity. The expertise he developed at Cambridge in time-of-flight mass spectrometry were to provide the inspiration for his future achievements in industry. In the mid-1970s, Bob did pioneering work using atom
probe field ion microscopy to investigate high electrostatic field surface interactions in a variety of materials including
Al, Fe, Ni, Mo, Au, Ir, Rh, Re, Ta, andWand he proposed the theory that all atoms undergo some sort of “rolling” motion during kink site field evaporation. He was the first winner of the IFES Müller Medal, in 1978. While working for VG Scientific Ltd in the early 1980s,
Waugh recognised that the liquid gallium metal ion source invented at Culham was ideally suited for focusing into a small spot. He modified the Culham design to insert it into an existing VG 10kV electron gun column, reversed the polarities of the focusing electrodes and almost instantly produced a 100nm FIB. He swiftly improved the focus to 50nm using a 30 kV column. These experiences enabled Bob and his coworkers to anticipate the potential unique
capability of a focused ion beam instrument to monitor a field ion specimen while it was being prepared. This lead to
the first experiment using a FIB to prepare specimens for atom probe tomography. The objective in this work was to bring grain boundaries into the apex region of a field ion specimen and the FIB was found to be extraordinarily useful at imaging such boundaries due to electron channeling contrast. Today the FIB is ubiquitous worldwide in materials science for both TEM and FIM specimen preparation. Waugh took atom probe expertise from Cambridge and
VG and commercialised the technique using a “Poschenrie- der” time-of-flight (TOF) mass spectrometer. By pulsing the FIB source, the TOF could be used to image and analyse organic molecules on surfaces because TOF has unlimited mass range. The world’s first imaging TOFSIMS was designed by Waugh and tested in 1985/86. The technique eventually resulted in MALDI-TOF – used for organic, pharmaceutical and medical analysis. After leaving VG, Waugh went on to develop magne-
tron sputtering machines for optical coatings and depositing anti-reflection coatings on spectacle lenses. His work led to important patents on machine and process designs. This equipment was used by retail optician stores offering a “one hour” service. Applied Vision won the Queen’s Award for Technological Achievement in 1997. Allen Robert Waugh was born on 1 January 1950 and
died on 23 March 2016. He is survived by his wife Sally and their two sons.
Prof. Michael Walls (University of Loughborough) Prof. Alfred Cerezo (formerly University of Oxford) Dr. David J. Larson (President, International Field Emission Society)
Prof. Dr. Franz-Wilhelm Röllgen (1937–2015)
Franz-Wilhelm was born in Germany in 1937, and after some war-time interruption attended a high school (“Gymnasium”) in Bonn. In 1957, he went on to study Chemistry at the University of Bonn, and stayed on to do research in the Institute of Physical Chemistry at the University, starting in the early 1960s. Apart from
a brief interlude in Japan, he spent his whole career there, retiring in 2002. Franz-Wilhelm’s scientific interests were in the field ionization mass spectrometry (FIMS) of organic molecules,
and particularly in the physical basis of related instrumental techniques. Initially he worked as part of the group headed by the late Professor H. D. Beckey, who was one of the FIMS pioneers, and then took over leadership of the group after Beckey’s illness-enforced retirement. Franz-Wilhelm was a regular attender at meetings of the
former International Field Emission Symposium in the days when the scope of the meeting was far wider than the scope ofAPTM currently is, and was one of the main links between the field ion and electron emission community and the chemical mass spectrometry community. He was a member of the Symposium International Steering Committee in the early1980s.
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