EMS MATERIALS SCIENCE & METROLOGY CATALOG 2019–20 EDITION INSTRUMENTATION Model 200 Dimpling Grinder (continued)
Transmitted or reflected illumination The platen that holds the specimen has a glass center section that allows light to be transmitted through the specimen from a source located beneath the specimen stage. The intensity level of the transmitted light is adjustable for optimal specimen observation. This is particularly important when dimpling silicon, which undergoes changes in color as the specimen approaches electron transparency.
The dimpling grinder also features illumination with reflected light from a high intensity lamp, powered by the dimpling grinder’s power supply.
Microscope for direct observation
A 40 X microscope attachment allows direct observation without the need to remove the specimen.
SPECIFICATIONS Grinding Control
Automated grinding rate control Grinding force adjustable with micrometer counterweight system Independent control of grinding wheel and specimen rotation speeds
Specimen Stage User Interface
Specimen Illumination Enclosure
Power Requirements Warranty
Precise specimen stage rotation Magnetic mount allows easy specimen positioning
All program inputs via front panel keypad Specimen thickness indicated on a liquid crystal display
Specimen observation in either transmitted or reflected light
Weight: 18 lb (8.2 kg) Size: 8.2 in (208 mm) width x 6.5 in (165 mm) height x 13.5 in (343 mm) depth
110/220 V AC, 50/60 Hz, 375 W One year
ORDERING INFORMATION Cat. No. 50178
Description
Model 200 Dimpling Grinder, with country-specific power cord
Items included with the Model 200 Dimpling Grinder: Cat. No.
Description
50178-01 50178-02 50178-03 50178-04 50178-05 50178-06 50178-07 50178-08 50178-09 50178-10 50178-11 50178-12 50178-13 50178-14 50178-15 50178-16 50178-17 50178-18
Aligning Ring: Magnetic Base Flattening Ring: Micarta Grinding Wheel: Wood (3) Platen: 0.75” diameter Platen Assembly: Glass Platen Holder
(3) Grinding Wheel: Micarta
Flattening Wheel: Stainless Steel (2) Grinding Wheel: Stainless Steel Grinding Wheel: Phosphor Bronze Wheel Locking Nut
Slurry Retainer Assembly Lamp Beam Block Wheel Hub Assembly
Semiconductor Polishing Wheel Microscope Attachment
Extended Base: Magnetic Platen Wrench: Ball End Hex Key - 1/16” - Steel
Model 160 Specimen Grinder
Mechanically prethins specimens for transmission electron microscopy (TEM). Greatly reduces the time spent during the final preparation process of ion beam milling.
FEATURES
Accurate and dependable Precisely controlled
Specimens up to 18 mm diameter
Large diameter provides excellent stability
Mechanically prethin specimens The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens in preparation for transmission electron microscopy (TEM). The grinder accommodates up to 18 mm diameter specimens.
The specimen grinder greatly reduces the time spent during the final preparation process of ion beam milling, which is typically used to achieve electron transparency.
No additional force needed
Consistently produce speci- mens with uniform thickness and parallel sides
Platen transferable to the Model 200 Dimpling Grinder
Optical image of an XTEM specimen consisting of 19 individual sections of a microelectronic material.
Produced by ultrasonic disk cutting and mechanical grinding.
A graduated scale allows the specimen thickness to be easily and precisely controlled; rotating the control knob advances the specimen 0.5 mm per rotation.
The large diameter provides excellent stability. Specimens with uniform thickness and parallel sides are consistently produced because of the precise fit of the specimen platen into the grinder body. The grinder is heavy enough to provide sufficient grinding force on the specimen.
One-step mounting
Qty. each
Qty. each each each 3/pk each each 3/pk each 2/pk each each each each each each each each each
If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.
This eliminates any possibility of damaging the specimen by demounting it for dimpling.
SPECIFICATIONS Specimen Size Dimensions
Weight Warranty Up to 18 mm diameter
3.0 in (76 mm) diameter x 2.6 in (66 mm) height 2.4 lb (1.1 kg) One year
ORDERING INFORMATION Includes: (4) Platen: 0.75” diameter, Platen Holder
Cat. No. Description 50179
Options 50179-01 50179-02
Qty Model 160 Specimen Grinder Goniometer Platen Specimen Lapping Kit each
each each
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