EMS MATERIALS SCIENCE & METROLOGY CATALOG 2019–20 EDITION
CALIBRATION STANDARDS & SPECIMENS MAGICAL™
- TEM Calibration Standard
MAG*I*CAL is the world’s smallest ruler and have been inducted into the Guinness Book of World Records,
A genius standard to perform the three major calibrations of a TEM:
Image Magnification Calibration Camera constant Calibration for Indexing Diffraction Patterns
Image/Diffraction Pattern Rotation Calibration (crystal relation features)
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. When time is short but you want to know how well your system is performing you need the X-Checker. Each X-Checker comes with the following:
Manganese to measure full width at half max detector resolution Aluminum and copper to perform spectral calibration.
Carbon to monitor calibration at the low end of the spectra for thin window detectors.
You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window.
The X-Checker™ The X-Checker™ BN comes with boron nitride for those who need a
more sensitive monitor of low end performance on thin window and windowless detectors.
Extra is the ultimate performance monitor for the
latest state of the art X-ray detectors. In addition to the standard features and boron nitride, there is a fluorine source to test resolu- tion at the fluorine K-alpha peak (industry standard for measuring low end resolution). As well it comes with a beryllium grid for the ultimate test of detector performance.
80058-ST 80058-BN 80058-EX
MAGNIFICATION CALIBRATION STANDARD FOR TEM Layer Thickness Values Surface )—(
consists of an ion milled cross section of a silicon single crystal consisting of a series of atomically flat layers of Si and SiGe, which have been grown epitaxially by MBE (molecular beam epitaxy). When the calibration structure is viewed in a TEM, it appears as a series of light and dark layers where the layer thicknesses are accurately known. The calibrated thickness measurements of these light (silicon) and dark (SiGe) layers are based on careful TEM measurements of the <111> lattice spacing of silicon, which is visible on the calibration sample itself, and are supported by x-ray diffraction measurements. The layer spacing are designed so that the sample can be used to calibrate the entire magnification range in a TEM, from 1,000X to 1,000,000X. As the sample is also a single crystal of silicon, the calibrations requiring electron diffraction information such as the camera constant and image/diffraction pattern rotation can also be performed easily and unambiguously. One single calibration sample can therefore be used to provide all three of the major TEM instrument calibration at all magnifications and all camera lengths.
MAG*I*CAL™
For a complete reference and technical information on MAG*I*CAL™
80069 102
, see our interactive website. MAG*I*CAL®
each
X-Checker™ X-Checker™ X-Checker™
TEM Checker™ , Standard
, With Boron Nitride each , Extra
each each
X-Checker™
TEM analysts also need to monitor the performance of their x-ray detectors. The TEM Checker contains 5 manganese disks in a standard grid storage box. Each disk is 3 mm in diameter and fits into the sample holder. The discs are not transparent to the beam but will give you a strong manganese peak to check the resolution of your EDS detector.
80059 TEM Checker™ each
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