search.noResults

search.searching

dataCollection.invalidEmail
note.createNoteMessage

search.noResults

search.searching

orderForm.title

orderForm.productCode
orderForm.description
orderForm.quantity
orderForm.itemPrice
orderForm.price
orderForm.totalPrice
orderForm.deliveryDetails.billingAddress
orderForm.deliveryDetails.deliveryAddress
orderForm.noItems
Page 84


www.us-tech.com


Santa Clara, CA — TEXMAC, the ex- clusive authorized distributor of Takaya flying probers in North America, is introducing its new dual- sided, high-performance APT-1600FD advanced flying probe test system. The APT-1600FD incorporates six top- side flying probes and four bottom-side flying probes, all with the speed and performance of the APT-1400F family. The APT-1600FD architecture provides average head-speed increas- es of up to 50 percent with throughput improvements of 30 to 50 percent over existing models. The APT-1600FD incorporates a new 10-flying-z-axis design, including four vertical flying probes that provide excellent access to


test points where conventional angled probes fail to contact.


Improved soft-touch controls virtually eliminate probe contact marks without compromising probe speed. New probe tips are available, including dagger-head probes for through-holes and inverse cone-head probes for connectors.


This high-end system is also equipped with a laser measuring device to allow compensation for any warpage of the board under test and to accurately measure the height of any component on the board. The completely upgraded x/y stage, com- bined with the positioning accuracy from its enhanced optical system,


provides a 25 percent improvement in probing accuracy over previous- generation Takaya systems. Next-gen, high-precision meas- urement electronics are embedded in the flying heads, greatly improving measurement accuracy and increasing functional capabilities. Enhanced function scanner board and communi- cations software make it easy to con- nect external instrumentation for additional functional-test capabilities. Four LED sensors (two top-side and two bottom-side) are available for the system, capable of measuring both color and brightness. They are driven by an easy-to-use powerful LED sensor-evaluation menu. Also,


March, 2018 TEXMAC Intros Takaya Advanced Flying Probe System


CCD color digital cameras (top- and bottom-side) with high-intensity, ring-shaped, white LEDs to provide lighting for 1D and 2D barcode recog- nition, optical inspection capabilities, and color distinction for vision tests of components, polarity check, offset,


Takaya APT-1600FD flying probe system.


etc. are standard, along with Takaya’s popular color Real Map Package for enhanced off-line pro- gram generation and increased pro- duction availability. Contact: TEXMAC, Inc., 2225 Martin Avenue, Suite K, Santa Clara, CA 95050  408-970-8500 E-mail: rmckenzei@texmacusa.com Web: www.texmac.com


See at IPC APEX, Booth 2932 Indium


Formulates Ultra-Low Voiding


Solder Paste


Clinton, NY — Indium Corporation is now offering its ultra-low-voiding Indium10.1HF solder paste. The air- reflow, no-clean, halogen-free, lead- free, solder paste has been formulated for ultra-low-voiding, especially in bot- tom termination component (BTC) assemblies.


Features include: high-ECM performance under low-standoff com- ponents, RF shields without proper ventilation, and components in low- clearance cavities; solder beading minimization; low bridging, slump


Indium10.1HF solder paste.


and solder balling; excellent wetting to a variety of common fresh and aged metallizations and surface fin- ishes; and high print transfer effi- ciency with low variation.


Indium10.1HF is compatible with lead-free alloys, such as SnAgCu, SnAg, and other alloy sys- tems favored by the electronics industry. This solder paste is halo- gen-free per IEC 61249-2-21, test method EN 14582. Contact: Indium Corp., 34 Robinson Road, Clinton, NY 13323  315-381-7524


E-mail: abrown@indium.com Web: www.indium.com


See at IPC APEX, Booth 1625 See at APEC, Booth 1355 and at APEX, Booth 2621


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136