search.noResults

search.searching

dataCollection.invalidEmail
note.createNoteMessage

search.noResults

search.searching

orderForm.title

orderForm.productCode
orderForm.description
orderForm.quantity
orderForm.itemPrice
orderForm.price
orderForm.totalPrice
orderForm.deliveryDetails.billingAddress
orderForm.deliveryDetails.deliveryAddress
orderForm.noItems
Page 100


www.us-tech.com Building Versatility into High-Throughput X-Ray Inspection By Olaf Szarlan, Public Relations, Viscom AG


D inspection at high speed is just as important for automated X-ray inspection (AXI) as it is for automated optical inspection (AOI). With time-optimized image acquisition technologies and efficient handling, in-line X-ray performance is increasing. There is also the potential to automate manual X-ray inspection (MXI) processes. In the inspection of electronic assemblies,


3


especially for components with hidden solder joints such as BGA or QFN packages, AOI is insufficient. Random samples with MXI are another option, but this is not always the best solution. Where product safety plays an especially crucial role, particularly in the automotive area, a fast, thorough inspection of solder joints is needed. This calls for in-line, high-speed AXI. On these systems, throughput is determined by the inspected assembly handling, since a fully protected housing with mechanical gates is required.


Fast, Precise Change Viscom’s new in- and out-feed system


for AXI reduces the time to change assem- blies to less than four seconds. This hard- ware works with several PCBs in the system simultaneously and moves them in overlapping time slices. Because of the shortened paths, the corresponding switching of assemblies from one position to the next is extremely quick and precise. This reduction in handling time shortens the


idle time overhead of changing assemblies. Actual productive time is the pure analysis time, in which the images are captured and evaluated. Optimizing the analysis time can bring addi-


tional significant throughput gains. During pro- gram creation, time-consuming 3D inspection can be restricted to the components for which it is


Viscom offers a wide range of X-ray systems.


acquiring several views for 3D reconstruction. With the right settings, electronic assemblies can also be optimally represented in the 3D image from predefined perspectives. For structures generally arranged on a grid,


such as BGA balls, irregularly arranged acquisi- tion positions are recommended. Because of the resulting suppression of periodic structures, arti- facts can be largely eliminated, significantly improving the 3D results of the planar computed tomography (PCT). During the development and revision of an AXI system, it is best to lay out the overall 3D


absolutely necessary. Everywhere else, faster orthogonal and angled processes are used.


3D AXI Hardware Optimized solutions for fast image acquisi-


tion also have a positive effect on the analysis time. High-value linear motors, which ensure that flat panel detectors on a cross table (x/y table) can be moved quickly to the different positions, sharply cut image acquisition times for variably angled radiation penetration, especially when


inspection area with ample space, giving the user flexibility to select the acquisition angle. In addi- tion to larger penetration angles and different per- spectives, larger PCBs can be inspected. For high throughput, it is important to use a flat panel detector with as large a field of view as possible.


Variety of Options 3D reconstruction processes are central to


determining the quality of the 3D image. Besides simple and fast methods, such as the addition process, Viscom AXIs implement the FDK (Feldkamp, Davis, Kress) process. Dirk Nülle, managing AXI product developer at Viscom responsible for the new X7056-II 3D AXI says, “This special process of fil- tered rear projection delivers better slice image reconstructions, especially for BGAs. However, it does take somewhat more computation time.” For a user-friendly display and for


basic image improvement, there are aids that include contrast filters and grayscale value adaptation (gamma correction). For sagging PCBs, height correction can be


added to the inspection run. This is accomplished by a tool that adapts the individual inspection positions. The calculated sag model of the assem- bly is then applied for each inspection method. The inspection system software should be as


easy to operate as possible. Depending on the task, either inspection quality or cycle time is the priori- ty. “In our experience, at least nine views are neces- sary to realize 3D. Yet sometimes, it turns out more acquisitions are needed, depending on shadowing and on which components are in opposite positions on a PCB assembled on both sides,” says Nülle.


Continued on next page


March, 2018


REDEXPERT. Würth Elektronik‘s online platform for simple component selection and performance simulation. www.we-online.com/redexpert


 The world’s most accurate AC loss model  Filter settings for over 20 electrical and mechanical parameters


 Inductor simulation and selection for DC/DC converters


 Available in seven languages  No login required  Ability to compare inductance/current and temperature rise/DC current using interactive measurement curves


 Online platform based on measured values  Order free samples directly  Direct access to product datasheets


#REDEXPERT See you at APEC & PCIM Europe


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136