This page contains a Flash digital edition of a book.
Page 60


www.us-tech.com For Electronic Assemblies, Reliability Rules Continued from previous page


accurate. At present, the most commonly


removed (cleaned) flux is no-clean flux. More assemblers clean electron- ic assemblies reflow ed with no-clean solder paste than any other type of solder paste. Some of the assemblies


reflowed with no-clean solder paste arguably do not need to be cleaned while others ab - solutely must be cleaned. There are many factors


to determine if an assembly should be cleaned. Factors include the cost of failure, the climatic environment for the assemblies, and the geo- graphic component layout.


Cost of Failure If a product fails due to


the presence of harmful residues (or any other fatal defect), what happens? While some assembly failures can lead to very dramatic results (death, destruction, etc.), oth- ers can lead to loss of profits and reputation. While some failures may be considered helpful (planned obsolesces), most do not fall into that category. Some assemblies can han- dle residues without failing and oth- ers can’t. How can a label on a solder paste jar know whether or not an assembly can handle residues creat- ed by a no-clean process? The fact is the label is misleading. As noted ear- lier, a more appropriate definition would be “low residue.” It is then a matter for the technology owner to


determine how much residue is acceptable on a specific assembly.


Climatic Environment Residue-related assembly fail-


ures are usually the result of three combined factors: electrical current, moisture, and residues. The right


corrosive or conductive residues. While an effective circuit-board bak- ing process can eliminate moisture, unless an assembly is encapsulated, moisture can return to the assembly, causing the previously described fail- ures. A common belief is that to pre- vent the reintroduction of moisture, an assembly can be conformally coat- ed or potted. While this is true when assemblies are deeply potted, it is not true when assemblies are conformal- ly coated. A conformal coat- ing, while providing an effec- tive barrier to fluids, is often permeable. Small amounts of moisture can penetrate a con- formal coating, resulting in undercoat corrosion and elec- trical migration and leakage. The third factor, resi -


Trident automatic defluxing system.


combination of these three ingredi- ents will result in electrical migration (dendritic growth) or electrical leak- age, neither of which is desirable. To eliminate any chance of electrical migration or leakage failures, all one has to do is eliminate one of the three factors. Obviously, eliminating elec- trical current is not an option. The second factor, moisture,


acts as a catalyst for electrical migra- tion or leakage when it comes into contact with electrical current and


dues, can be eliminated. With a residue-free assembly, elec- trical current and moisture alone do not have anything to form a current path with. No current path means no elec- trical migration or electrical leakage.


Component Layout For component layouts,


the component-to-component and component-to-board spacings must be considered. As the spacing decreases, so too does the volume of tolerable residue. For those who may wonder how


to determine how much residue is contained on an electronic assembly, the answer involves both good news and bad news. The good news is fast, easy, and affordable testing systems


IPC approved resistivity of solvent extract (cleanliness) tester.


The volume of acceptable, toler-


able residues back in the 1970s was many times more than would be acceptable today. Some have sug- gested that a new test for circuit- board cleanliness is required. Perhaps a better concept is to


internally reject the current (and obsolete) cleanliness pass/fail stan-


Continued on page 68


 Electronics, Inc.


Design and Development Low-cost Procurement Services •  Component, Subassembly and Turnkey Manufacturing


• 


Knight Electronics designs, manufactures and ships electronic components, PC boards, cords & cables, subassemblies, extrusions, die castings, injection molded plastics, turnkey and 


 


 Designed in the USA  Built in Asia


 Inspected in the USA and Asia  





         


ORION FANS 


PC Boards & Subassemblies


Turnkey Assemblies


    


  


are available to determine how much residue is on an assembly. There are also well-defined cleanliness stan- dards, originally published as mili- tary standards, and subsequently morphed into (IPC) standards. The bad news is the cleanliness standard most used today was actually devel- oped in the 1970s. It was developed during a time before surface-mount- technology (SMT) components, and it has never been changed.


March, 2014


Extrusions


Electronic Components


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116