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October, 2017


www.us-tech.com


Page 69


Enhanced Manufacturing Services 4.0: Philosophy and DfT 4.0 Continued from page 65


Traditional commercial DfT


matic data; verify the testability by conducting electrical rules checking that reflects the design for test (DfT) guidelines. Simulating the test strat- egy prior to the layout phase helps to minimize the need for physical access to detect defects. This can reduce test point requirements by up to 70 percent.


Mechanical Design for Test. Also called accessibility analysis and often incorrectly referred to as DfT, this is the optimization of test probe placement according to the test strat- egy. Probe access information can then be used for estimating test cov- erage, modeling the cost and calcu- lating the production yield and TL9000 initial return rates.


Design to Build and Design to Test. Lean test is driven by test cov- erage estimation that uses theoreti- cal models to reflect the capabilities of test and inspection strategies. These test strategies include: auto- mated placement machines, solder paste inspection (SPI), automated optical inspection (AOI), automated X-ray inspection (AXI), boundary scan test (BST), flying probe test (FPT), in-circuit test (ICT), and func- tional test (FCT). These virtual machines can be


tuned to reflect the exact test and measurement capabilities of each individual target tester. TestWay simulation is extremely precise and deviation between the virtual and the physical worlds is typically around 1 percent. TestWay provides interoper-


ability from native CAD data to any targeted assembly machines, AOI, AXI, ICT, FPT, and BST systems.


Test for Excellence. Once test and inspection programs have been debugged and released, it is impera- tive to be able to assess the complet- ed test program or test report and compare the coverage between the estimated and measured analyses. By analyzing the program running on the shop floor, it highlights what is actually being tested. Industry-standard metrics are


used in the coverage analysis to make direct comparisons and to identify any misalignment between the theoretical and real coverage. Any test escapes can be identified and rectified prior to mainstream production. Traceability tools used in the


diagnosis and repair loops can take advantage of detailed test coverage analysis to improve the diagnostic resolution and speed up the repair process.


Test for Designability. Test data is an important contributor to design improvement, once continuous DfX (design for excellence) feedback between production and design has been established.


EMS 4.0: Design for Test The EMS 4.0 workflow uses


data analytics to provide continuous assessment at each stage in the design-to-delivery workflow, with feedback provided at each stage. Companies are then better equipped to deliver defect-free products to their customers at minimum cost. The challenge is how to detect or pre- vent defects from occurring, so that only good products are shipped to the customer.


tools work only from the layout stage, which is too late in the process. Design data must be ana- lyzed at the earliest stage in the product life cycle by importing schematic data. Electrical DfT rules violations should be identified and


rectified prior to commitment for board layout in order to prevent cost- ly design re-spins. These rules can include standard and customer-spe- cific checks, relating to company requirements. With a centralized knowledge database, the same prob- lems will never be repeated.


Test point requirements must


also be identified pre-layout, during the schematic capture stage. This reduces the need for unnecessary test access, saving on PCB real estate, par- ticularly on high-density boards. TestWay simulates the test


EMS 4.0 workflow: continuous DfX feedback during the entire design-to-delivery flow improves decision-making, time-to-market and results in better quality products at lower cost.


10/6/17 9:50 AM


strategy with any combination of inspection and test machines, deliver- ing the highest test coverage. This spe- cial combination provides electrical rules analysis, test point analysis, test strategy optimization and test cost modeling, based purely on schematic information. This, in turn, provides valuable layout guidelines that can be used to optimize the PCB layout. Once the PCBA layout is com-


Continued on page 75 Don’t blink or you’ll miss it. SQ3000™ CMM is the World's Fastest.


Powered by MRS Technology


Verify measurements in seconds, not hours. Our SQ3000™ CMM 3D scanning and inspection technology leaves traditional CMMs in the dust.


Fast and highly accurate, repeatable and reproducible measurements for metrology applications in the manufacturing of a wide variety of products such as PCBs, semiconductors and consumer electronics.


The new SQ3000™ CMM system, powered by MRS technology utilizes CyberCMM™. This comprehensive software suite of 3D inspection and coordinate measurement tools provides highly accurate, 100% metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y to name a few.


www.cyberoptics.com Copyright © 2017. CyberOptics Corporation, Inc. All rights reserved.


See at productronica, Hall A2 Booth 439


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