1 9/9/14 10:25 AM October, 2017 www.us-tech.com


MRS-Enabled Inspection Machines from CyberOptics


Minneapolis, MN — CyberOptics® Corporation has introduced its SQ3000™-DD 3D AOI system with its new ultra-high-resolution multi- ple-reflection suppression (MRS) sensors. The company has also un- veiled its SE3000™ 3D SPI and SQ3000™ 3D CMM, both powered by MRS technology.


3D fusing algorithms merge the im- ages together and deliver microscop- ic image quality at production speed. The company’s SE3000 SPI sys-


tem incorporates MRS sensor tech- nology with fine resolution for accu- racy, repeatability and reproducibili- ty — even for small paste deposits. Combined with easy-to-use software,


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SQ3000-DD 3D AOI system.. The new SQ3000-DD 3D AOI


dual-lane, dual-sensor system maxi- mizes flexibility for various PCB widths. This design provides the abil- ity to inspect high-volume assem- blies, the convenience to inspect dif- ferent assemblies and board sizes si- multaneously on different lanes, and also to switch from dual-lane to sin- gle-lane mode for large boards. The SQ3000-DD also provides the versa- tility to choose two of the same or two different proprietary MRS sensors, both of which identify and reject mul- tiple reflections caused by shiny com- ponents and reflective solder joints. The new ultra-high-resolution


MRS sensor option provides fine res- olution for 008004 (0201 metric) and microelectronics applications, where a great degree of accuracy and in- spection reliability is critical. Both MRS sensor options simultaneously capture and transmit multiple im- ages in parallel, while sophisticated


SPI has reached a new level of preci- sion for stringent requirements. The new SQ3000 3D CMM sys-


tem, powered by MRS technology uses CyberCMM™, a new software suite for coordinate measurement. In a lab or production environment, the MRS- enabled SQ3000 CMM system is fast and accurate, with repeatable and re- producible measurements for metrolo- gy applications in manufacturing. CyberCMM, an extensive suite


of CMM tools, provides 100 percent metrology-grade measurement on all critical points quickly, including coplanarity, distance and height. The


system is also very easy to set up. Contact: CyberOptics Corp.,


5900 Golden Hills Drive, Minneapo- lis, MN 55416 % 763-542-5000 E-mail: info@cyberoptics.com Web: www.cyberoptics.com r


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