LV-STEM/SEM analytical The world’s only combination of a ≤ 0.4 nm resolution1


with cold FEG & true immersion lens


SEM


with full STEM capabilities including EDX and EELS, close to 0.2 nm in STEM2


1: Guaranteed; 2: M.Konno, et.al., Ultramicroscopy 145 (2013)


High-Resolution, Low-Voltage, Analytical STEM/SEM


- Imaging from 100 V to 30,000 V - 0.7 sr for EDX


- Elemental maps at ≥ 11,000 pixels/s with Hitachi’s own EELS


Deceleration technology at 300 V and DOF correction R Ramachandran and T Salguero, Dept of Chem. and Georgia Electron Microscopy, Univ. of Georgia


This new breed of microscopes delivers for research aiming at nanotechnology, materials science, and life sciences.


Graphene 1 Layer Graphene 2 Layers Graphene 3 Layers Graphite


Amorphous Diamond


Hitachi SU9000 FE-STEM/SEM


EELS spectra of all C allotropes Note Plasmon shift with increasing number in Graphene layers


Think Outside the Lab Hitachi High Technologies America, Inc. www.hitachi-hightech.com/us 800-253-3053 Copyright © 2017 Hitachi High Technologies America, Inc. All rights reserved.


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