May, 2017
www.us-tech.com
New Levels of Traceability for Electronics Manufacturing
By Michael Ford, Senior Marketing Development Manager, Mentor Graphics Corp.
The standard, IPC-1782, defines four levels of material and process traceability. The adoption of IPC-1782 will allow many companies to progress from basic traceability methods to higher levels. The traceability specification applies to all
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aspects of electronics manufacturing, including the assembly and mechanical operations that go into products. The main focus of the standard’s commit- tee, however, was on electronic assembly itself. The committee started with risk assessment and mapped the degree of severity and probability of a defect to its effect on a business. Gathering extreme levels of
traceability data — each scrap of data from every available process — would be too much for most of the industry. Instead, the committee determined that the level of data collection need- ed to be assessed against the risk associated with potential product defects.
Four Levels of Data Collection The group used the IPC product
classification system as a guide for different levels of traceability data collection. The IPC-1782 standard defines four levels for both material traceability and process traceability.
At the first level, material traceabil- ity consists of a part number listed to the work order. For process traceabil- ity, significant process exceptions are listed to the work order. Data integri- ty is in the range of 3 sigma and its collection and storage is considered 90 percent manual. Reporting lead time required is 48 hours and data retention time is the life of the prod- uct plus one year.
Level two incorporates a unique material ID for each work order and critical process characteristics, as well as exceptions, are listed to serial- ized PCB assemblies. Data integrity is in the range of 4 sigma, with collec- tion and storage at least 70 percent automated. Reporting lead time is 24 hours with data retention for the life of the product plus three years.
At level three, a unique material ID is assigned to each PCB assembly and all key process characteristics and exceptions are listed to serialized PCB assemblies. Data integrity is in the range of 6 sigma and collection and storage are at least 90 percent automated. The reporting lead time required is only one shift and data retention is for the life of the product plus five years.
The fourth level assigns a unique material ID to the reference designa- tor and all available metrics are cap- tured and listed to serialized PCB assemblies. Data integrity is in the range of 9 sigma, collection and stor- age are fully automated and reports are available at the completion of the process. Level four data retention time is for the life of the product plus seven years. The levels “low,” “medium,”
“serious,” and “high” taken from the risk assessment matrix equate rough- ly to the four levels of traceability defined by IPC-1782. The IPC prod- uct classification system of Class 1, 2, 3, and Class 3 space equate in a simi- lar way. In each case, especially as IPC- 1782 is initially introduced, there will
Selective Conformal Coating - Protective coating of electrical components
he IPC (Association Connecting Electronics Industries®) has developed a new standard and specification for traceability practices.
be variations depending on the history and nature of the product and the market it goes into. The traceability levels are provided as guidelines. The level of material and process traceability can often be different, with additional exceptions deter- mined between the product owner and manufac- turer. However, once the level is agreed upon, the specification of what is the appropriate traceabili- ty data is clear. As well as the degree of granularity, the dif-
Example risk assessment matrix taken from MIL-STD-882.
ferent levels of traceability also define key factors of performance for the collection and use of the data. The greater degree of automation in data col- lection, either directly from machines or as part of
Continued on page 73
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