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www.us-tech.com


July, 2017


ZEISS: FIB-SEM for 3D Analytics and Sample Prep


Thornwood, NY — ZEISS has intro- duced a new generation of focused ion beam scanning electron micro- scopes (FIB-SEMs) for high-end applications in research and industry. The ZEISS Crossbeam 550 offers a significant increase in resolution for imaging and material characterization, as well as a speed gain in sample prepa- ration, over previous generations. Nanostructures such as


composites, metals, biomaterials, or semiconductors can be investi- gated with analytical and imag- ing methods in parallel. The Crossbeam 550 allows simultane- ous modification and monitoring of samples, resulting in fast sam- ple preparation and high throughput for such applications as cross-sectioning, TEM lamella preparation or nano-patterning. The system’s new Tan dem


decel mode enables enhanced res- olution together with maximum image contrast at low landing ener- gies. The Gemini II electron optics deliver excellent resolution at low voltage and high probe current simul- taneously. The FIB column combines the highest available FIB current of 100 nA with the new FastMill mode, allowing for highly-precise and more efficient material processing and imaging in parallel. The new process for automated emission recovery increases user-friendliness and opti- mizes the FIB column for repro- ducible results during long-term experiments.


Material scientists profit from


excellent 3D analytical properties, due to a fully-integrated module for 3D EDS analyses with ZEISS Atlas


Crossbeam 550 FIB-SEM.


5. In the life sciences, ZEISS Crossbeam 550 is an attractive option with its enhanced resolution at low voltages and stability for long- term 3D tomography. It is also possi- ble to integrate the new workstation into correlative workflows and to combine it with light, X-ray or ion


beam microscopy. Contact: Carl Zeiss Microscopy,


LLC, One Zeiss Drive, Thornwood, NY 10594 % 800-233-2343 E-mail: info.microscopy.us@zeiss.com Web: www.zeiss.com


See at SEMICON West, Booth 5214


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