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www.us-tech.com
July, 2017
ZEISS: FIB-SEM for 3D Analytics and Sample Prep
Thornwood, NY — ZEISS has intro- duced a new generation of focused ion beam scanning electron micro- scopes (FIB-SEMs) for high-end applications in research and industry. The ZEISS Crossbeam 550 offers a significant increase in resolution for imaging and material characterization, as well as a speed gain in sample prepa- ration, over previous generations. Nanostructures such as
composites, metals, biomaterials, or semiconductors can be investi- gated with analytical and imag- ing methods in parallel. The Crossbeam 550 allows simultane- ous modification and monitoring of samples, resulting in fast sam- ple preparation and high throughput for such applications as cross-sectioning, TEM lamella preparation or nano-patterning. The system’s new Tan dem
decel mode enables enhanced res- olution together with maximum image contrast at low landing ener- gies. The Gemini II electron optics deliver excellent resolution at low voltage and high probe current simul- taneously. The FIB column combines the highest available FIB current of 100 nA with the new FastMill mode, allowing for highly-precise and more efficient material processing and imaging in parallel. The new process for automated emission recovery increases user-friendliness and opti- mizes the FIB column for repro- ducible results during long-term experiments.
Material scientists profit from
excellent 3D analytical properties, due to a fully-integrated module for 3D EDS analyses with ZEISS Atlas
Crossbeam 550 FIB-SEM.
5. In the life sciences, ZEISS Crossbeam 550 is an attractive option with its enhanced resolution at low voltages and stability for long- term 3D tomography. It is also possi- ble to integrate the new workstation into correlative workflows and to combine it with light, X-ray or ion
beam microscopy. Contact: Carl Zeiss Microscopy,
LLC, One Zeiss Drive, Thornwood, NY 10594 % 800-233-2343 E-mail:
info.microscopy.us@
zeiss.com Web:
www.zeiss.com
See at SEMICON West, Booth 5214
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