NEWS REVIEW Mesuro
can extract data from non-linear devices
MESURO, which offers testing and services solutions for the semiconductor industry is now delivering measurements needed for non-linear devices.
The firm says that whatever measurement set or application is needed from non- linear device data, its measurement services can deliver.
The company’s laboratory allows for device testing up to 100W CW packaged devices to 6GHz Fundamental; up to 20W CW packaged devices in the X band; fundamental test up to 67GHz; and fixture design and manufacture.
Device characterisation allows customers to evaluate their device performance utilising Mesuro’s test platforms for immediate use within designs and to gain experience of the WaveForm Engineering process that can aid in business case justification and provide confidence through verified data sets. All parameters available in the test platforms can be measured, including DCIV, S-Parameters, Pin/Pout and Power and Efficiency Contours.
With device modelling, non-linear measurement data has been exploited in various ways to create behavioural models for high frequency transistors. These include frequency-domain descriptive behavioural models, including Poly Harmonic Distortion (PHD) Models, S-functions and X-Parameters.
Formulations of these models have been developed in the travelling wave domain with a desire to represent non-linear behaviour of high frequency transistors.
Work demonstrated using the Cardiff Model formulations, based on PHD models, has shown that by considering higher order mixing terms in the PHD formulation, a better fit can be achieved around a more compact file size, without sacrificing accuracy.
When considering the performance of RF Power Amplifiers (PAs) or indeed other non-linear devices, it is the terminal RF I-V Waveforms that are the unifying theoretical link between transistor technology, circuit design, and system performance.
From a non-linear PA design perspective, the integration of RF WaveForm Engineering capability, whether passive or active, with RF Waveform measurement capability, is essential. With such systems, the practical design of PAs achieved by directly employing the theoretically-based WaveForm Engineering approach is now experimentally possible.
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www.compoundsemiconductor.net June 2013
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