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www.us-tech.com
July, 2014
Nikon Metrology: Nanofocus X-Ray Inspection
Transformers and Inductors Surface Mount (and Plug In)
Audio Transformers Impedance Levels 10 ohms to 250k ohms, Power Levels to 3 Watts, Frequency Response ±3db 20Hz to 250Hz. All units manufactured and tested to MIL-PRF-27. QPL Units available.
Power & EMI Inductors Ideal for Noise, Spike and Power Filtering Applications in Power Supplies, DC-DC Converters and Switching Regulators
Pulse Transformers 10 Nanoseconds to 100 Microseconds. ET Rating to 150 Volt Microsecond, Manufactured and tested to MIL-PRF-21038.
Multiplex Data Bus
Pulse Transformers Plug-In units meet the requirements of QPL-MIL-PRF 21038/27. Surface units are electrical equivalents of QPL-MIL-PRF 21038/27.
DC-DC Converter
Transformers Input voltages of 5V, 12V, 24V And 48V. Standard Output Voltages to 300V (Special voltages can be supplied). Can be used as self saturating or linear switching applications. All units manufactured and tested to MIL-PRF-27.
400Hz/800Hz
Power Transformers 0.4 Watts to 150 Watts. Secondary Voltages 5V to 300V. Units manufactured to MIL-PRF-27 Grade 5, Class S (Class V, 1550
C available). See Pico’s full Catalog immediately at
www.picoelectronics.com Call toll free 800-431-1064 PICO
in NY call 914-738-1400 Fax 914-738-8225
Electronics, Inc.
143 Sparks Ave. Pelham, N.Y. 10803 E Mail:
info@picoelectronics.com www.picoelectronics.com
Low Profile from .18"ht.
Brighton, MI — Nikon Metrology’s latest XT V 160 NF is a high-preci- sion, flat-panel based X-ray inspec- tion system that facilitates real-time imaging and defect analysis of next- generation wafer-level, semiconduc- tor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, the inspection system offers exceptional feature recognition compared to any product available on the market today. The product is a high-perform-
ance system providing advanced and innovative functionality, capable of inspecting the most challenging elec- tronic components and assemblies. The in-house developed NanoFocus source with nanoscale x-ray spot size, high precision manipulator and 3 Megapixel flat panel detector with high dynamic range results in a fea- ture recognition capability below 0.1µm. The system has an unusual 360° continuous rotating detector axis which enables oblique angle views of up to 60° to the center of the detector panel. The system offers intelligent region of interest lock, which main- tains feature view with changing mag- nification or angle view. The large 580 x 580mm tray
enables inspection of large PCBAs, multiple components or pallets cou- pled with advanced automated soft- ware capabilities. The highly accurate and precise
anti-vibration sample manipulator equips the NF system for next-gener- ation laminography inspection tech- niques with advanced cross sectional view capability to detect defects as small as a few microns. It provides a
method of inspecting a region of interest which can be challenging to inspect with 2D radiography, such as 3D stack dies, BGA pad cracks or multilayer boards such as dual-sided boards or multi planes and this with- out the need to rotate the sample or
Nanofocus x-ray inspection system.
cut it down in size. The system is equipped with
Inspect-X software for intuitive and productive electronics X-ray inspec- tion XT V 160 NF is equipped with Inspect-X 4 —acquisition and analysis software that focuses on improved usability and productivity. The soft- ware facilitates real-time inspection as well as the creation of automated pro- grams using the user-friendly graphi- cal user interface. Productivity is increased by offering intuitive opera- tor control, faster creation of inspec- tion programs and more robust image
inspection algorithms. Contact: Nikon Metrology, Inc.,
12701 Grand River, Brighton, MI 48116 % 810-220-4360 E-mail:
marketing.nm-us@Nikon.com Web:
www.nikonmetrology.com
See at Semicon West Booth #6055.
Delivery-Stock to one week for sample quantities
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