This page contains a Flash digital edition of a book.
Page 60 Continued from page 52


around time. New products can be built on the SMT line almost immedi- ately and then brought into test. Any DFX measures can be communicated straight back to development from the SMT area, something you don’t always get when working with a con- tract manufacturer.”


www.us-tech.com


under one roof. If you outsource a part of that loop, you end up spend- ing a lot of time communicating.”


Testing Guarantees Quality Testing is critical to maintain-


ing repeatable performance and high quality in the XetaWave radios. During Flash/power up, firmware is


the entire temperature range to con- firm that it meets specifications at all temperatures. It is then given a throughput test. In this phase of manufacturing, the radios are func- tionally tested to ensure they suc- cessfully transmit the required and specified amount of data. Following this, additional test-


ing includes a line stretch, a sensitiv- ity test, and a final test. During final test, after assembly to a serial or Ethernet interface PCB, the entire


July, 2014 XetaWave Achieves Advanced SMT Production With SIPLACE


functionality of the unit is tested against the specification of the radio. With so much testing, in-house capa- bility was absolutely required. Contact: XetaWave, LLC, 258


South Taylor, Louisville, CO 80027 % 303-449-1313 E-Mail: info@xetawave.com Web: www.xetawave.com or ASM Assembly Systems, 3975 Lakefield Ct., Ste 106, Suwanee, GA 30024 % 770-797-3189 Web: www.siplace.com r


PXI Expansion Enhances Auto Dashboard Testing


Continued from previous page


instructions were automatically gen- erated as part of the ICT program development. However, additional instructions had to be created by the manufacturer to account for the addi- tion of an optical camera box for measuring LED luminosity and in - tensity, pneumatic pushers to test switches, a microphone to measure audio, and a printed-circuit-board (PCB) marker.


Ian Linn shows off DEK Horizon 8 printer, which provides highly precise paste deposits.


Salihagic adds that “the testing,


tuning and configuration of the prod- uct can then be done without being rushed which ensures maximum quality. (Outsourcing only allows some generic board level testing.) Also, the developers get a very fast turn-around on their designs, which helps with time to market immense- ly. Communication is also so much quicker and easier when you have design, manufacturing and test


written to the radio and some basic functions of the radio (e.g., power supply, current draw, resistance checks) are tested. Next, the radio is tuned across


its frequency range and power set- tings are calibrated. Due to the harsh environmental operating conditions for which the radios are screened, thermal testing is critical. The radio is tested from -45 to +85°C to check functionality across


Integrating and debugging ICT and functional tests. This last step included qualification of the program and the fixture and verify- ing that the tests were reliable and repeatable for production testing. This step also provided the dash- board controller manufacturer the opportunity to compare and contrast the new combined ICT/functional test solution with the original func- tional test solution.


The benefits of the combined approach won out easily in the eyes


of the manufacturer because it sig- nificantly lowered both the acquisi- tion and operational costs. Lower acquisition costs were achieved because the TestStation solution cost 20 percent less than the original functional test system and was twice as fast. Calculations showed that the manufacturer saved 60 percent ($300,000) for every two functional test systems replaced with a single TestStation system. Those savings were achieved without sacrificing any reduction in test capacity. Lower operational costs were


achieved from less expensive fixture kit pricing, reduced factory floor space, faster program development times, less defect escapes, faster repair times (due to more accurate ICT diagnos- tics), and lower support costs. Contact: Teradyne, Inc.,


Systems Test Group, 600 Riverpark Drive, MS-NR-7001-1, North Reading, MA 01864 % 978-370-6238 E-mail: alan.albee@teradyne.com Web: www.teradyne.com r


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96