96 Monday PM ~Poster!
M O N D A Y
3:30 PM 70 Environmental Considerations in Thermo- dynamic Investigation of Bulk Samples by SEM;M Castagna; FEI Company; H Fujitani; FEI Company Japan; D Phifer; FEI Company Netherlands
Poster # 24
3:30 PM 71 Time-Resolved EDS Studies with Rapid Heat- ing and FEG-SEM; S Mick; Protochips, Inc; N Erdman, T Laudate; JEOL
Poster # 25
3:30 PM 72 Vapor Phase Editing of CarbonNanotube Based Nanodevices: Use of the NanoBot Nanomanipulator with Gas Delivery; VMancevski; Xidex Corporation; P Rack; The University of Tennessee at Knoxville
Poster # 26
3:30 PM 73 The SEM/FIB Workbench: Nanorobotics Sys- tem Inside of Scanning Electron or Focussed Ion Beam Micro- scopes;V Klocke, I Burkart,R Kaufmann; KlockeNanotechnik GmbH
Poster # 27
A-09 Optimizing Imaging forMicroanalysis: Realizing the Benefits of the NewDetectorOptions
Poster Session Monday 3:30 PM Room: Exhibit Hall
3:30 PM 74 STEM Dislocation Analysis and Image Simula- tions; P Phillips, M Mills; Ohio State University; M De Graef; Carenegie Mellon University
Poster # 28
3:30 PM 75 Digital BSE Imaging on SEMs; T Agemura, T Nomaguchi; Hitachi High-Technologies; D Joy; University of Tennessee
Poster # 29
3:30 PM 76 Exploring CCD Camera Parameters with Off- axis Electron Holography; K Dudeck; McMaster University; E Voelkl; FEI Company; G Botton;McMaster University Poster # 30
3:30 PM 77 Technique for Complex Averaging of Electron Holograms; R McLeod; University of Alberta; M Bergen, M Malac; National Institute for Nanotechnology
Poster # 31
3:30 PM 78 Simulation of Energy Selective Signal Amplifi- cation in Gas Environment of Variable Pressure SEM;V Nedela; Institute of Scientific Instruments of the ASCR, Czech Republic
Poster # 32
3:30 PM 79 Detection of Secondary Electrons by Scintilla- tion Detector at VP SEM; J Jirak; Brno University of Technol- ogy, Czech Republic; V Nedela; Institute of Scientific Instruments of the ASCR, Czech Republic
Poster # 33
3:30 PM 80 Construction and Testing of a Dual Faraday Cup for Low Vacuum and Environmental Scanning Electron Microscope; SWight, A Konicek; National Institute of Stan- dards and technology
Poster # 34
3:30 PM 81 Helium IonMicroscopy of Cellular Interactions of Nanoparticles; B Arey, V Shuttahanandan, G Orr; Pacific Northest National Laboratory
Poster # 35
3:30 PM 82 Design and Performance of a Near Ultra High Vacuum Helium Ion Microscope; R van Gastel; University of Twente; L Barriss, C Sanford; Carl Zeiss NTS LLC; G Hla- wacek; University of Twente; L Scipioni, A Merkle, D Voci; Carl Zeiss NTS LLC; C Fenner; LVestus Energy Inc; HJW Zandvliet, B Poelsema; University of Twente
Poster # 36
3:30 PM 83 High-Resolution SEM Imaging with Aberra- tion Correction for Highly Precise Measurement of Semicon- ductors; M Konno, Y Suzuki; Hitachi High-Technologies Corporation; H Inada, K Nakamura; Hitachi High- Technologies Corporation
Poster # 37
A-17 Electron Holography Poster Session
Monday 3:30 PM Room: Exhibit Hall
3:30 PM 84 Low-Dose Strain Mapping by Dark-Field In- line Electron Holography; B Özdöl, C Koch, P van Aken;Max Planck Institute for Metals Research, Germany
Poster # 38
3:30 PM 85 Development of Sample-Scanning Electron Ho- lography; M Takeguchi, K Mitsuishi; National Institute for Materials Science, Japan; D Lei, M Shimojo; Saitama Insti- tute of Technology, Japan
Poster # 39
3:30 PM 86 Coherent Electron Interference of a Split HOLZ Line from a Strained Silicon Crystal; R Herring; University of Victoria, Canada; K Saitoh, N Tanaka, T Tanji; Nagoya University, Japan
Poster # 40
3:30 PM 87 Phase Masks for Electron Vortex Beams;R Herring, A Schuetze, E Humphrey; University of Victoria, Canada
Poster # 41
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