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Tuesday PM ~Poster! 115


3:30 PM 378 ~MSA PTSA Award! FIB TEM Sample Prep- aration of Deeply Buried Interfaces; M Rye, J Michael, N Yang; Sandia National laboratories


Poster # 133


3:30 PM 379 Effect of Ion Currents on the Morphology of Focused Ion Beam Milled Patterns on a Single Crystalline Diamond; WI Lee, R Golnabi, A Calabro, C Queenan, D Becker, D-Y Kim; Bergen County Academies


Poster # 134


3:30 PM 380 The Study of the FIB Induced Damage in Diamond; S Rubanov; University of Melbourne, Australia; A Suvorova; University of Western Australia, Australia Poster # 135


3:30PM 381 Significance of Outer Keratin Cortices to Struc- tural Color Production in Feathers Revealed through Focused Ion BeamMilling andMicrospectrometr;MShawkey;Univer- sity of Akron; A Avishai, N Avishai; Case Western Reserve University


Poster # 136


3:30 PM 382 Effect of an Electric Field within Microscope Monohaz FIB between a Micro Manipulator Sharp and the Ion Trap of the Electron Detector; JA Gómez, AP Hernandez, A Duarte; Centro de Investigacion enMateriales Avanzados, Mexico


Poster # 137


A-07Microanalysis Standards Poster Session


Tuesday 3:30 PM Room: Exhibit Hall


3:30 PM 383 Natural Analogs of Synthetic ReferenceMate- rials: Assessing the Limits of Homogeneity Testing at the Picogram Scale; S Michalak; University of Freiberg, Ger- many;A Renno;University of Freiberg, Germany; SMerchel, F Munnik; Helmholtz-Zentrum Dresden-Rossendorf, Ger- many; M Wiedenbeck; Helmholtz-Zentrum Potsdam, Ger- many


Poster # 138


3:30 PM 384 Assessing Microanalytical Performance Using Secondary Standards: Results of an Electron Probe Interlabo- ratory Comparison Using Four Natural Volcanic Glasses;S Kuehn; Concord University; D Froese; University of Alberta, Canada; P Shane; University of Auckland, New Zealand Poster # 139


3:30 PM 385 EPMA on Copper-Gold Alloys—A CCQM/ SAWG Pilot Study; D Hodoroaba; BAMFederal Institute for Materials Research & Testing; R Marinenko, J Small; NIST, National Institute of Standards and Technology; W Unger; BAM Federal Institute for Materials Research & Testing Poster # 140


3:30 PM 386 Bringing Standardized Processes to Atom- Probe Tomography—Part 1: Establishing Standardized Termi- nology; E Marquis; University of Michigan; I Anderson; National Institute for Standards & Technology; F Danoix; University of Rouen; R Forbes; University of Surrey; B Gault; University of Sydney; T Kelly; Cameca Instruments Inc; M Miller; Oak Ridge National Laboratory; M Moody; University of Sydney; F Vurpillot; University of Rouen Poster # 141


3:30 PM 387 MSA/MAS Hyper-Dimensional Spectral File Format—A Straw-Man Proposal;MKundmann; e-Metrikos; N Wilson, A Torpy; CSIRO Process Science and Engineer- ing; N Zaluzec; Electron Microscopy Center, Argonne Na- tional Laboratory


Poster # 142


3:30 PM 388 Applications of Thin-Film Standards in Ana- lytical Electron Microscopy;MWatanabe; Lehigh University Poster # 143


A-10 Advances in 3D ElectronMicroscopy Poster Session


Tuesday 3:30 PM Room: Exhibit Hall


3:30PM 389 RecoveringMissing Information inDislocation- Particle Interactions by Diffraction Contrast Dual-Axes Elec- tron Tomography; G Liu, I Robertson; University of Illinois, Urbana-Champaign


Poster # 144


3:30 PM 390 Simulating STEM Imaging of Nanoparticles inMicrometers-Thick Substrates; N Poirier-Demers,H Dem- ers, D Drouin; Université de Sherbrooke, Canada; N de Jonge; Vanderbilt University School of Medicine


Poster # 145


3:30 PM 391 Novel Approach for 3D Chemical and Elastic State Assessment of Alloyed Strained Nanostructures; A Isaac, LMontoro, AMalachias; Brazilian Synchrotron Light Labo- ratory, Brazil; GMedeiros-Ribeiro;Hewlett-Packard Labora- tories; A Ramirez; Brazilian Synchrotron Light Laboratory, Brazil


Poster # 146


3:30 PM 392 Phase Plate Enhanced Contrast Reveals Struc- ture of Follicular Melanin Granules; GA Camacho-Bragado; L’Oréal; H Qian; National Institute for Nanotechnology, Canada; F Dixon, H Bryant; L’Oréal; M Malac; National Institute for Nanotechnology, Canada


Poster # 147


3:30PM 393 Reduction of Channeling Effects in Aberration- Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes; D Hernández-Maldonado, M Herrera, MDLP Guerrero-Lebrero, J Pizarro, P Galindo, S Molina; Universidad de Cádiz, Spain


Poster # 148


U E S D A Y


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