174 Company Listing
USA Ph: 800-446-8811 Ph2: 650-969-8811 Fax: 650-965-0764
info@duniway.com www.duniway.com Specializes in vacuum equipment and supplies; ion pumps and controls; flanges, gaskets, bolts and nuts; vac- uum gauges and controls; mechanical pumps and rebuild kits; supplies ~oils, greases, hoses, bell jars! diffusion pumps and leak detectors. Equipment rebuilding services and a variety of re- conditioned equipment
E. A. Fischione Instruments, Inc.
9003 Corporate Circle Export, PA 15632 USA Ph: 724-325-5444 Fax: 724-325-5443
info@fischione.com www.fischione.com
Fischione Instruments features TEM Specimen preparation Instruments in- cluding the lectropolisher, Dimpling Grinder, Ultrasonic Disk Cutter, Ion Mill ~TEM/SEM! and Plasma Cleaner. The NanoMill TEM specimen prepa- ration system results in artifact-free preparation. The ASaP enhances SEM specimen quality. Imaging Instruments include the HAADF detector and TVIPS cameras. TEM Tomography SpecimenHolders for single-axis, dual- axis, on-axis and ultra-narrow gap applications.
e2v scientific instruments ltd. 311 Sirius House,Watery Lane Wooburn Green, HighWycombe Buckinghamshire HP10 0AP UK Ph: 44 1628 533060 Fax: 44 1628 533034
e2vsi@e2v.com www.e2vsi.com
An independent EDS detector special- ist offering EDS system upgrades from Si~Li! to SDD detectors, OEM product supply and a full international Si~Li! detector repair facility. Our SiriusSD upgrade products allow replacement of existing Si~Li! detectorswithanew
1316
SDD detector while retaining the exist- ing system processor and software.
EDAX, Inc.
91 McKee Drive Mahwah, NJ 07430 USA Ph: 201-529-6277 Fax: 201-529-3156
tina.wolodkowicz@ametek.com www.edax.com
EDAX is the world’s leading technol- ogy supplier of EDS, EBSD, WDS, and Micro-XRF systems providing cutting edge technical and performance solu- tions for materials characterization. Ease of use is at the core of the TEAMTM EDS Analysis System boost- ing user productivity, reducing analysis time, and minimizing potential for er- rors. The Orbis elemental analyzer pro- vides a platform for small and micro spot X-ray analysis and mapping.
ElectronMicroscopy Sciences 615 1560 Industry Road P.O. Box 550 Hatfield, PA 19440 USA Ph: 215-412-8400 Fax: 215-412-8450
sgkcck@aol.com www.emsdiasum.com
ElectronMicroscopy Sciences will have on display their revolutionary new Tis- sue slicers, Processors ~LYNX!, Micro- wave ovens, Plunge Freezers, Field Microscopes, and Vacuum Equipment including our High Resolution Sputter Coaters and Critical Point Driers. As well on display will be their Brand New Catalog which includes their en- tire line of chemicals, supplies and ac- cessories for all of the microscopy fields as is shown in there 750page catalog.
ETS-Lindgren
400 High Grove Boulevard Glendale Heights, IL 60139 USA Ph: 630-307-7200 Fax: 630-307-7571
info@ets-lindgren.com www.ets-lindgren.com
The ETS-Lindgren Magnetic Active Compensation System ~MACS! pro-
1408 918
vides cost-effective, maintenance-free environmental magnetic shielding so- lutions for high precision Electron Beam or high resolution Electron Microscopy instrumentation. These re- liable systems provide real time com- pensation of environmental magnetic field fluctuations caused by moving ve- hicles, trains, elevators, electrical distri- bution equipment and other sources.
Evex Analytical
857 State Road Princeton, NJ 08540 USA Ph: 609-252-9192 Fax: 609-252-9091
sales@evex.com www.evex.com
The premier manufacture of electron microscopes and X-ray analyzers for nanotechnolgy. Evex provides power- ful yet, affordable tabletop and tradi- tional SEM’s for both experienced and entry level electron microscopists. The Mini-SEM ~tabletop SEM! and the eveXiumVZ series ~standard size SEM! are practical and easy to use. Both plat- forms can be equipped with Evex’s award winning X-ray NanoAnalysis ~EDX! system and high speed, light element LN2 free detectors. The Nano- Analysis software also includes, ad- vanced imaging for particle counting, sizing and measurement, “Fast Map” for mapping at near video speeds; in- dex mapping, saving a spectra at every pixel of the image, EvexTSA ~trace sen- sitive analysis! and VideoSEM; Evex’s full motion video.
FEI Company
5350 NE Dawson Creek Drive Hillsboro, OR 97124 USA Ph: 503-726-7500 Fax: 503-726-7509
fei_info@fei.com www.fei.com
With more than 60 years of innovation and leadership, FEI sets the perfor- mance standard for TEM, SEM and DualBeamTM SEM/FIB. FEI instru- ments provide 3D characterization, analysis and modification/prototyping at resolutions ranging from nanometer
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