128 Wednesday PM ~Platform!
3:00 PM 587 Noncompaction of the Left Ventricle: Report of Two Caseswith ElectronMicroscopic Findings;S Siew;Mich- igan State University;MMarkey; Sparrow Forensic Services
A-03Microanalysis at 60 Years: A Symposium Dedicted to Raimond Castaing
Session Chairs:
Paul Carpenter,Washington University Ron Gauvin,McGill University Ed Vicenzi, Smithsonian Institution
John Fournelle, University of Wisconsin PlatformSession
Wednesday 1:30 PM Room: 204
1:30 PM 588 ~Invited! Raymond Castaing’s Ion Micro- scope and Secondary Ion Mass Spectrometry; P Williams; Arizona State University
2:00 PM 589 Automated Classification of SIMS Images Using K-means Clustering; A Konicek, J Lefman, C Szakal; National Institute of Standards and Technology
2:15 PM 590 ~Invited! Trace ElementMicro-Analytical Im- aging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS); A Netting, J Payne, B Wade, T Raimondo; University of Adelaide
W E D N E S D A Y
2:45 PM 591 Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa; E Scroggs, J Friel, A Davatzes; Temple University
3:00 PM 592 ~MAS Distinguished Scholar! Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19; S Seddio, B Jolliff, R Ko- rotev, P Carpenter;Washington University
A-06 Advances in EELS and EFTEM Session Chairs:
Gianluigi Botton,McMaster University
Peter A. van Aken,Max-Planck Institute for Metals Research, Stuttgart
PlatformSession Wednesday 1:30 PM Room: 213/214
1:30 PM 593 ~Invited! Analysis and Artifacts in EELS Spec- trum Imaging; J Mundy, L Fitting Kourkoutis, H Xin, D Muller; Cornell University
2:00 PM 594 Multivariate Statistical Analysis Strategies of EELS Spectral Images; M Van Benthem, P Kotula, P Lu; Sandia National Laboratories
2:15 PM 595 Applications of Atomic-Resolution EELSMap- ping at Low kV; B Schaffer; SuperSTEM Laboratory, UK; F Azough; University of Manchester, UK; D Abou-Ras, S Schmidt; Helmholtz-Zentrum, Germany; M Schaffer, M Sarahan, Q Ramasse; SuperSTEM Laboratory, UK; R Cabal- lero; Helmholtz-Zentrum, Germany
2:30 PM 596 HAADF and EELS Combined Studies of a New Generation of Materials for Ni-MH Batteries; V Serin; Centre National de la Recherche Scientifique, Université Paul Sabatier, France; CMagen; TALEM, Instituto de Nano- ciencia de Aragón, France; M Hytch, R Serra; Centre Na- tional de la Recherche Scientifique, Université Paul Sabatier, France
2:45 PM 597 Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification; M Watanabe; Le- high University; F Allen; Lawrence Berkeley National Laboratory
3:00 PM 598 CornellSpectrumImager:OpenSourceSpec- trum Analysis with ImageJ; P Cueva, R Hovden, D Muller; Cornell University
3:15 PM 599 High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Inter- faces andNanostructures; K Dudeck,MCouillard,NGauque- lin, L Gunawan, S Hosseini Vajargah; McMaster University, Canada; S Lazar; FEI Electron Optics, Netherlands; D Ros- souw, Y Shao, G Zhu, G Botton; McMaster University, Canada
A-08 Remote & Collaborative Instrument Operation for Research, Teaching andMaintenance
Session Chairs:
John Mansfield, University of Michigan Gary M. Brown, ExxonMobil
PlatformSession Wednesday 1:30 PM Room: 208
1:30 PM 600 ~Invited! Remote Nanoimaging on Mars— Results of the Atomic Force Microscope Onboard NASA’s Phoenix Mission; S Gautsch, D Parrat, N de Rooij; Ecole Polytechnique Fédérale de Lausanne, Switzerland;U Staufer; Technical University Delft, The Netherlands; J Marookian, M Hecht; Jet Propulsion Laboratory; S Vinjendran; ESTEC, The Netherlands; H Sykulska, W Pike; Imperial College London, United Kingdom
2:00 PM 601 Computer Integrated X-Ray Systems and In- telligent Control Systems for Remote Microscopy and Power Savings; R Wuhrer; University of Technology, Sydney, Aus- tralia; K Moran;Moran Scientific Pty Ltd, Australia
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