102 Tuesday AM ~Platform!
10:30 AM 162 ~Invited! New Opportunities for In Situ Science Based on the TEAM Platform; D Miller; Argonne National Laboratory; U Dahmen; Lawrence Berkeley Na- tional Laboratory; E Stach; Brookhaven National Laboratory
11:00AM 163 Development of aDirectObservationMethod of Biological Materials for E-TEM; H Minoda, T Okabe, Y Inayoshi; Tokyo University of Agriculture and Technology
11:15 AM 164 Environmental TEM, A CTF Approach for Atmospheric Lattice Imaging; M Suzuki, T Yaguchi; Hitachi High-Technologies Corporation
11:30 AM 165 Investigation of Electron-Phonon Scattering for High Spatial Resolution TemperatureMeasurement;L He, H Robert; Rensselaer Polytechnic Institute
U E S D A Y
T
11:45 AM 166 Movie Mode Dynamic Transmission Elec- tron Microscopy (DTEM): Multiple Frame Movies of Tran- sient States in Materials with Nanosecond Time Resolution;T LaGrange, B Reed, W DeHope, R Shuttlesworth, G Huete; Lawrence Livermore National Laboratory
A-04 Focused Ion Beam Symposium Session Chairs:
Lucille Giannuzzi, L.A. Giannuzzi & Associates LLC Noel Smith, Oregon Physics, LLC
PlatformSession Tuesday 8:15AM Room: 108
8:15 AM 167 ~Invited! Advanced FIB Sample Preparation for High Performance TEM Analysis; F Altmann, R Salzer,M Simon, S Huebner, C Grosse, A Graff; Fraunhofer Institut for Mechanics of Materials, Germany
8:45 AM 168 FIB Target Preparation for 20 kV STEM—A Method for Obtaining Ultra-Thin Lamellas; L Lechner, J Biskupek, U Kaiser; Ulm University, Germany
9:00AM 169 Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV—A Key Requirement for Successful Application; M Schaffer, B Schaffer, Q Ra- masse; SuperSTEM, UK; M Falke; Bruker Nano GmbH, Germany; D Abou-Ras, S Schmidt, R Caballero; Helmholtz- Zentrum, Germany; K Marquardt; GFZ German Research Centre for Geosciences, Germany
9:15 AM 170 Concentrated Ar Ion Milling for Aberration- Corrected Electron Microscopy: A Review; R Cerchiara, P Fischione, J Liu, J Matesa, A Robins; EA Fischione Instru- ments, Inc.
9:30 AM 171 Advanced Physical Failure Analysis Tech- niques Using 3D Rotation Imaging from Plane-View TEM Sample; H-J Kang, J-G Gwak, T-S Park, T-S Back, H-J Kim, O Han; Hynix Semiconductor Inc, Korea
9:45 AM 172 Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials; J-G Zheng; Univer- sity of California, Irvine; S Xie; University of Oregon
A-07Microanalysis Standards Session Chairs: Heather Lowers, US Geological Survey
Eric Steel, National Institute of Standards & Technology Paul Carpenter,Washington University
PlatformSession Tuesday 8:00AM Room: 213/214
8:00 AM 178 ~Invited! Development Strategies for Creat- ing a Suite of Reference Materials for the In-situ Microanaly- sis of Non-conventional Raw Materials; A Renno; TU Bergakademie Freiberg, Germany; S Merchel; Institute of Ion Beam Physics and Materials Research, Helmholtz- Zentrum Dresden-Rossendorf e V, Germany; P Michalak; TU Bergakademie Freiberg, Germany; F Munnik; Institute of Ion Beam Physics and Materials Research, Helmholtz- Zentrum Dresden-Rossendorf e V, Germany; M Wieden- beck; GFZ German Research Centre for Geosciences, Helmholtz Centre, Germany
8:30 AM 179 ~Invited! New U-Th-Pb Isotope Reference Material for SIMS; A Kennedy; Curtin University, Australia
9:00 AM 180 ASTM Grain Size by EBSD—A New Stan- dard; J Friel; Temple University; S Wright; EDAX-TSL; S Sitzman; Oxford Instruments America
9:15 AM 181 Developing Standard Reference Materials for Analytical Electron Microscopy; E Steel, J Davis, A Herzing; National Institute of Standards & Technology
10:00 AM Coffee Break
10:30 AM 173 FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates;F Rivera, J Abbott, R Davis, R Vanfleet; Brigham Young University
10:45 AM 174 In Situ Probe Approaches for Charge Reduc- tion, Sample Manipulation, and Modified Total Release Lift- out; K Langworthy, JDitto;University of Oregon; CHartfield; Omniprobe, Inc; D Krinsley; University of Oregon
11:00 AM 175 On Probe Thinning of Samples for Bulk or STEM Type EDS Analysis; B Miller; Nanolab Technologies, Inc; C Hartfield; Omniprobe
11:15 AM 176 ~Invited! Cryo-FIB Machining: An Alterna- tive to TEM Cryo-Sections Cut with Diamonds?; M Hayles; FEI Company, Netherlands; M de Winter, C Schneijden- berg, J Meeldijk; Utrecht University, Netherlands; H Per- soon, U Luecken; FEI Company, Netherlands; A Verkleij; Utrecht University, Netherlands; B Humbel; Lausanne Uni- versity, Switzerland
11:45 AM 177 TEM Specimen Preparation with Plasma FIB Xe+ Ions; L Giannuzzi; L A Giannuzzi & Associates LLC; N Smith; Oregon Physics, LLC
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