Wednesday PM ~Poster! 135
3:30 PM 703 New Results with High Quantum Efficiency Silicon Drift Detectors; A Niculae; PNDetector GmbH, Ger- many; L Andricek; Max Planck Institut Halbleiterlabor, Germany; M Bornschlegl; PNDetector GmbH, Germany; R Eckhardt; PNSensor GmbH, Germany; J Herrmann, O Jar- tischin; PNDetector GmbH, Germany; S Jeschke, P Lechner, L Mungenast, B Schweinfest, H Soltau; PNSensor GmbH, Germany; L Strüder; Max Planck Institut Halbleiterlabor, Germany
Poster # 256
3:30 PM 704 New Design andMeasurements with 60 mm2 Rococo2 SDD Detectors; A Niculae,MBornschlegl; PNDetec- tor GmbH, Germany; R Eckhardt; PNSensor GmbH, Ger- many; J Herrmann, O Jaritschin; PNDetector GmbH, Germany; P Lechner, A Liebel, H Soltau; PNSensor GmbH, Germany; G Schaller, F Schopper, L Strüder; Max Planck Institut Halbleiterlabor, Germany
Poster # 257
3:30 PM 705 Characterization of 16MegaPixel CMOS De- tector for TEM by Evaluating Single Events of Primary Elec- trons;HTietz, R Ghadimi, I Daberkow,C Kofler, P Sparlinek; TVIPS GmbH, Germany
Poster # 258
3:30 PM 706 New Type of Silicon-Based Zernike Thin-Film Phase Plate; S Irsen; Center of Advanced European Studies and Research, Germany; S Pattai, P Kurth, J Wamser; Kon- TEM Phase Contrast Systems, Germany
Poster # 259
3:30 PM 707 Pixellated CMOS Photon Detector for Second- ary Electron Detection in the Scanning Electron Microscope; JH Chuah; University of Cambridge, United Kingdom; D Holburn; University of Malaya,Malaysia
Poster # 260
3:30 PM 708 Advanced Window Grids for Work at the Intersection of Electron and Optical Imaging; C Striemer, T Gaborski; Simpore, Inc
Poster # 261
3:30 PM 709 Characterizing a Liquid Repellent Nano- coating Using a Multi-Technique Approach; T Nunney, P Mack, R White, O Greenwood; Thermo Fisher Scientific, UK; M Wall, B Strohmeier; Thermo Fisher Scientific; S Coulson, D Evans; P2i Limited, UK
Poster # 262
P-01 A.V. CreweMemorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond
Poster Session Wednesday 3:30 PM Room: Exhibit Hall
3:30 PM 710 Advances in STEM-CELL a Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolu- tion in STEM-HAADF; V Grillo; CNR, Italy
Poster # 263
3:30 PM 711 Quantitative Annular Dark Field Images of Silicon (001) Crystal; Y Oshima; Oska University, Japan; S Kim, Y Tanishiro, K Takayanagi; Tokyo Institute of Technol- ogy, Japan
Poster # 264
3:30 PM 712 Vortex Beams for Atomic Resolution Dichro- ism; J Idrobo; Vanderbilt University; S Pennycook; Oak Ridge National Laboratory
Poster # 265
3:30 PM 713 Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope; H Inada, K Tamura, K Nakamura, M Konno, Y Suzuki; Hitachi High Technologies; D Su, J Wall; Brookha- ven National Laboratory; RF Egerton; University of Alberta, Canada; Y Zhu; Brookhaven National Laboratory Poster # 266
3:30 PM 714 Channeling Contrast in Sub-Ångström Reso- lution High-Angle Annular Dark-Field Images of Planar Inter- faces; J Liu; University of Missouri-St Louis; LF Allard; Oak Ridge National Laboratory
Poster # 267
3:30 PM 715 Usual and Unusual Effects in ADF-STEM Imaging of Dopant Atom in Crystals; A Mittal, A Gunawan, KA Mkhoyan; University of Minnesota
Poster # 268
3:30 PM 716 Atomic Resolution Defect Analysis Using Low Angle ADF-STEM; P Phillips; Ohio State University; L Kova- rik; Pacific Northwest National Lab; M Mills; Ohio State University
Poster # 269
3:30 PM 717 Novel Multivariate Statistical Analysis Meth- ods for STEM/EELS; M Sarahan; SuperSTEM Laboratory, Daresbury; F de la Peña; Commissariat a l’Energie Atom- ique; Q Ramasse; SuperSTEM Laboratory, Daresbury; M Walls; Laboratoire de Physique des Solides
Poster # 270
3:30 PM 718 Auto-Tuning of Aberrations Using High- Resolution STEM Images by Auto-Correlation Function;H Sawada; JEOL;MWatanabe; Lehigh University; E Okunishi, Y Kondo; JEOL
Poster # 271
W E D N E S D A Y
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88 |
Page 89 |
Page 90 |
Page 91 |
Page 92 |
Page 93 |
Page 94 |
Page 95 |
Page 96 |
Page 97 |
Page 98 |
Page 99 |
Page 100 |
Page 101 |
Page 102 |
Page 103 |
Page 104 |
Page 105 |
Page 106 |
Page 107 |
Page 108 |
Page 109 |
Page 110 |
Page 111 |
Page 112 |
Page 113 |
Page 114 |
Page 115 |
Page 116 |
Page 117 |
Page 118 |
Page 119 |
Page 120 |
Page 121 |
Page 122 |
Page 123 |
Page 124 |
Page 125 |
Page 126 |
Page 127 |
Page 128 |
Page 129 |
Page 130 |
Page 131 |
Page 132 |
Page 133 |
Page 134 |
Page 135 |
Page 136 |
Page 137 |
Page 138 |
Page 139 |
Page 140 |
Page 141 |
Page 142 |
Page 143 |
Page 144 |
Page 145 |
Page 146 |
Page 147 |
Page 148 |
Page 149 |
Page 150 |
Page 151 |
Page 152 |
Page 153 |
Page 154 |
Page 155 |
Page 156 |
Page 157 |
Page 158 |
Page 159 |
Page 160 |
Page 161 |
Page 162 |
Page 163 |
Page 164 |
Page 165 |
Page 166 |
Page 167 |
Page 168 |
Page 169 |
Page 170 |
Page 171 |
Page 172 |
Page 173 |
Page 174 |
Page 175 |
Page 176 |
Page 177 |
Page 178 |
Page 179 |
Page 180 |
Page 181 |
Page 182 |
Page 183 |
Page 184 |
Page 185 |
Page 186 |
Page 187 |
Page 188 |
Page 189 |
Page 190 |
Page 191 |
Page 192 |
Page 193 |
Page 194 |
Page 195 |
Page 196 |
Page 197 |
Page 198 |
Page 199 |
Page 200 |
Page 201 |
Page 202 |
Page 203 |
Page 204