Thursday PM ~Platform! 149
A-05 Advancing Data Collection and Analysis for Atom Probe Tomography
Session Chairs: Brian Gorman, Colorado School of Mines
Karen Henry, National Institute of Standards and Technology
PlatformSession Thursday 1:30 PM Room: 205
1:30 PM 921 Metrics for Characterization of Atom Probe Instrument Performance; I Anderson, E Steel, K Henry; National Institute of Standards & Technology
1:45 PM 922 ~Invited! Toward Atomic-Scale Tomography: The ATOM Project; T Kelly; Cameca Instruments, Inc; M Miller; Oak Ridge National Laboratory; K Rajan; Iowa State University; S Ringer; University of Sydney; A Borisevich; Oak Ridge National Laboratory; N Dellby, O Krivanek; Nion Company
2:15 PM 923 Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction; B Gorman; Colorado School of Mines; J Shepard; Cameca Instruments, Inc; R Kirchhofer; Colorado School of Mines; J Olson, T Kelly; Cameca Instruments, Inc
2:30 PM 924 First Principles Modeling Studies of Field Evaporation: Preliminary Studies Relevant to the Atomscope; K Rajan, J Peralta; Iowa State University; M Miller; Oak Ridge National Laboratory; T Kelly; Cameca Instruments; S Ringer; University of Sydney
2:45 PM 925 Improved Yield and Data Quality in Atom Probe Tomography; R Ulfig, E Oltman, D Lenz, T Payne, T Prosa, D Larson; Cameca Instruments, Inc
3:00 PM 926 Atom Probe Tomography of Engineered Nano- structures with Complex Field Evaporation Behavior;KHenry, A Herzing, I Anderson; National Institute of Standards and Technology
3:15 PM 927 Atom Probe Tomography of Interfaces at the Near-Lattice Level; P Felfer, S Ringer, J Cairney; Sydney University, Australia
3:30 PM 928 Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe To- mography Data; M Keenan; V Smentkowski; General Elec- tric Global Research Center; R Ulfig, E Oltman,D Larson, T Kelly; Cameca Instruments, Inc
3:45 PM 929 ~Invited! A Lattice-Rectified and Detection Efficiency Compensated APT Reconstruction; M Moody, A Ceguerra, A Breen, B Gault, L Stephenson, R Marceau, S Ringer; The University of Sydney, Australia
4:15 PM 930 Toward Automated Optimization of Recon- struction of Atom Probe Data; D Larson, B Geiser, T Prosa, T Kelly; Cameca Instruments, Inc
4:30 PM 931 Estimation of Specimen Lensing in Atom Probe Tomography; D Haley; Oxford Materials; T Petersen; Australian Centre for Microscopy and Microanalysis; GDW Smith; Oxford Materials
4:45 PM 932 Analytic Hitmap Equationof the Ideal Spher- ical Evaporator; B Geiser, E Oltman, D Larson, T Prosa, T Kelly; Cameca Instruments, Inc
A-06 Advances in EELS and EFTEM Session Chairs:
Gianluigi Botton,McMaster University
Peter A. van Aken,Max-Planck Institute for Metals Research, Stuttgart
PlatformSession Thursday 1:30 PM Room: 213/214
1:30 PM 933 ~Invited! Aberration Corrected STEM-EELS: Applications to Magnetic Materials; M Varela; Oak Ridge National Laboratory; J Gazquez, F Bruno, J Garcia- Barriocanal; University Complutense; M Torija, M Sharma; University of Minnesota; M Oxley, M Prange; Oak Ridge National Laboratory; C Leighton; University of Minnesota; S Pantelides; Oak Ridge National Laboratory; J Santamaria; University Complutense; S Pennycook; Oak Ridge National Laboratory
2:00 PM 934 In-Situ Study of Nb Oxide Thin Films Using Electron Energy Loss Spectroscopy; R Tao, R Klie; University of Illinois, Chicago; A Romanenko, L Cooley; Fermilab
2:15 PM 935 Energy Loss Near-Edge Fine Structure of Ox- ygen K of Spinel NixMn3−xO4; J Li, SW Ko, S Trolier- McKinstry; Pennsylvania State University; E Dickey; North Carolina State University
2:30 PM 936 ~Invited! Data Analysis Methods for Modern Analytical Electron Microscopy; M Walls; Université Paris- Sud, France; F de la Pena; Commissariat a l’Energie Atomique-LETI, France
3:00 PM 937 ~Invited! Observation of the Hole State Sym- metry by Anisotropy of Inelastic Scattering Accompanied by Inner-Shell Excitation; K Saitoh, K Momonoi, N Tanaka; Nagoya University, Japan
3:30 PM 938 Site-Specific Transition Metal 3d Electron Configurations Studied by Energy Loss with Channeled Elec- trons; K Tatsumi, S Muto; Nagoya University, Japan; J Rusz; Uppsala University, Sweden
3:45 PM 939 Simulation of STEM-EELS Including Diffrac- tion and Solid-State Effects I: Mixed Dynamic Form Factor Beyond the Dipole Approximation; M Prange, M Oxley; Vanderbilt University; S Pennycook; Oak Ridge National Laboratory; S Pantelides; Vanderbilt University
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