Tuesday AM ~Platform! 105
11:45 AM 219 Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials; M Chisholm; Oak Ridge National Laboratory; G Duscher; University of Ten- nessee;WWindl; The Ohio State University
P-02 Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries
Session Chairs:
Klaus Van Benthem, University of California at Davis Naoya Shibata, University of Tokyo, Japan
PlatformSession Tuesday 8:00AM Room: 206
8:00 AM 220 ~Invited! Structure and Energy of Equili- brated Ni-Al2O3 Interfaces; H Meltzman, W Kaplan; Technion—Israel Institute of Technology
8:30 AM 221 The Role of g-Al2O3 Single Crystal Support to Pt Nanoparticles Construction; Z Zhang, L Li; University of Pittsburgh; L-L Wang; Iowa State University; S Sanchez; University of Illinois at Urbana-Champaign; Q Wang; Ye- shiva University; D Johnson; Iowa State University; A Fren- kel; Yeshiva University; R Nuzzo; University of Illinois at Urbana-Champaign; J Yang; Yeshiva University
8:45 AM 222 Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets; L Montoro, A Isaac; Brazilian Synchrotron Light Laboratory; L Giovanetti, F Requejo; Universidad Nacional de La Plata, Argentina; A Ramirez; Brazilian Synchrotron Light Laboratory
9:00 AM 223 ~Invited! Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates; A Thron, K van Benthem; Univeristy of California, Davis
9:30 AM 224 Formation of Single-Orientation Epitaxial Islands of TiSi2 on Si (001) Using Sr Passivation; JJ Kim; Arizona State University; A Posadas, R Dargis, M Choi, A Demkov; University of Texas, Austin; DJ Smith; Arizona State University
9:45AM 225 Order inNanometer-Thick Intergranular Films at Au-Sapphire Interfaces; M Baram; Harvard University; S Garofalini; Rutgers University; W Kaplan; Technion-Israel Institute of Technology
10:00 AM Coffee Break
10:30 AM 226 ~Invited! ABF STEM Characterization of Light Elements in Ceramic Interface; Y Ikuhara; University of Tokyo; R Hunag; Japan Fine Ceramics Center, Nagoya; S Findray, T Mizoguchi, N Shibata; University of Tokyo; T Hirayama; Japan Fine Ceramics Center, Nagoya
11:00 AM 227 Grain Boundary Complexions in TiO2 Bic- rystals Doped with CuO; S Ma; Lehigh University; T Penny- cook,MOxley;Vanderbilt University;D Leonard;University of Tennessee; C Kiely; Lehigh University; S Pennycook; Oak Ridge National Laboratory;M Harmer; Lehigh University
11:15 AM 228 Quantitative Study of an Incommensurate Grain Boundary Using Aberration Corrected Microscopy;AR Gautam, T Radetic; Lawrence Berkeley National Labora- tory; F Lançon; Laboratoire de Simulation Atomistique ~L_Sim!, France; U Dahmen; Lawrence Berkeley National Laboratory
11:30 AM 229 HRTEM Study of Dissociated Dislocation Structures in Low-Angle Grain Boundaries of Alumina;E Tochigi,N Shibata;University of Tokyo; A Nakamura; Osaka City University; T Mizoguchi, T Yamamoto, Y Ikuhara; University of Tokyo
11:45 AM 230 Evolution of a Small Angle Boundary from a Perfect Lattice During Annealing of a Cross Rolled Aluminium Sample;M Shamsuzzoha; University of Alabama
P-04 Imaging and Spectroscopy of Carbon-based Nanomaterials and Devices
Session Chair:
Moon Kim, University of Texas at Dallas PlatformSession
Tuesday 8:30AM Room: 204
8:30 AM 231 ~Invited! Imaging and Spectroscopy of Car- bon Nanostructures with 80 and 20 keV Electrons; U Kaiser; Ulm University, Germany
9:00 AM 232 Low-Voltage (40 kV) Aberration-Corrected, Monochromated, Imaging for Carbon Nanostructures;D Bell, C Russo; Harvard University; D Kolmykov; Carl Zeiss NTS
9:15 AM 233 The Effect of Dose and Accelerating Voltage on Graphene Imaging in TEM;HCalderon; Instituto Politec- nico Nacioal, Mexico; C Song, B Barton, C Kisielowski; Lawrence Berkeley National Laboratory
9:30 AM 234 ~Invited! In-Situ Nanomechanics of Carbon Nanotubes and Graphene; J Huang; Sandia National Labora- tories; F Ding; Hong Kong Polytechnic University; Q Liang, J Feng, J Li; University of Pennsylvania
10:00 AM Coffee Break
10:30AM 235 ~Invited! Imaging Grains and Grain Bound- aries in Single-Layer Graphene: An Atomic Patchwork Quilt; P Huang, A van der Zande, C Ruiz-Vargas, W Whitney, M Levendorf, Y Zhu, J Park, P McEuen, D Muller; Cornell university
11:00AM 236 ~MSAApkarian Scholar! Atomic Scale Study of Point Defects in Graphene Using STEM; W Zhou, M Prange, M Oxley, S Pantelides; Vanderbilt University; S Pennycook, J Nanda, C Narula; Oak Ridge National Labora- tory; J-C Idrobo; Vanderbilt University
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