Tuesday PM ~Platform! 109
A-09 Optimizing Imaging forMicroanalysis: Realizing the Benefits of the NewDetectorOptions
Session Chairs:
Brendan Griffin, University of Western Australia David Joy, Oak Ridge National Laboratory
Dale Newbury, National Institute of Standards and Technology
PlatformSession Tuesday 1:30 PM Room: 207
1:30 PM 286 Unconventional Imaging with Backscattered Electrons; I Müllerová, S Mikmekova, M Hovorka, L Frank; Institute of Scientific Instruments of the ASCR, Czech Republic
1:45 PM 287 ~Invited! The Contrast Mechanisms of LL- BSE Electrons in FE-SEM Characterization of Polymer, Single Proteins, and Oxidization States of Elements; H Jaksch; Carl Zeiss SMT
2:15 PM 288 Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed; A Liebel, H Soltau, R Eckhardt; PNSensor GmbH; O Jaritschin, A Niculae; PNDetector GmbH; F Schopper;MPI Halbleiterlabor
2:30 PM 289 A New Solid State Photomultiplier Device for Electron Imaging; N Barbi; PulseTor LLC; C Piemonte; Fondazione Bruno Kessler; F Lopour; Tescan; RMott; Pulse- Tor LLC
2:45 PM 290 Influence of Backscattered Electron Imaging Geometry on Channeling Contrast of Dislocations; R Kamala- dasa, Y Picard; Carnegie Mellon University
3:00 PM 291 ~Invited! Full Field X-Ray Imaging— Microanalysis between Table Top and Free Electron Laser Experiments; H Soltau, R Hartmann, A Hartmann, P Holl, S Ihle, C Thamm; PNSensor GmbH; A Liebel, I Ordavo; PNDetector GmbH; G Schaller, F Schopper, L Strüder;MPI Halbleiterlabor
1:30 PM 292 ~Invited! 3D STEM for Imaging Biological Samples and Nanoparticles; A Lupini, S Pennycook; Oak Ridge National Laboratory; N de Jonge; Vanderbilt Univer- sity School of Medicine
2:00 PM 293 STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers-Thick Substrates; H Dem- ers, D Drouin; Université de Sherbrooke, Canada; N de Jonge; Vanderbilt University School of Medicine
2:15 PM 294 Optimized Tomographic Acquisition and Re- construction for Highly Faceted Nanostructures with Isotropic Resolution; P Ercius; Lawrence Berkeley National Laboratory
2:30 PM 295 A New Approach to Electron Tomography for The ATOMProject; T Petersen;Australian Centre forMicros- copy and Microanalysis, Australia; M Miller; Oak Ridge National Laboratory; T Kelly; Cameca Instruments, Inc; K Rajan; Iowa State University; S Ringer; Australian Centre for Microscopy and Microanalysis, Australia
2:45 PM 296 The Tri-Beam System: Femtosecond Laser Based Tomography in a Dual-Beam FIB; M Echlin; Univer- sity of Michigan; A Mottura, T Pollock; University of Cali- fornia, Santa Barbara
3:00PM 297 3D EDXMicroanalysis by FIB-SEM: Enhance- ment of Elemental Quantification; P Burdet, C Hébert, M Cantoni; Federal Institute of Technology of Lausanne, Switzerland
3:15 PM 298 Focused Ion Beam Tomography of Diffusion Media for Fuel Cells; E Wargo, A Hanna, A Çeçen, C John- son, S Kalidindi, E Kumbur; Drexel University
U E S D A Y
T
A-10 Advances in 3D ElectronMicroscopy Session Chairs:
Niels de Jonge, Vanderbilt University School of Medicine Christian Kuebel, Karlsruhe Institute of Technology, Germany
Alioscka Sousa, National Institutes of Health PlatformSession
Tuesday 1:30 PM Room: 102
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