110 Tuesday PM ~Platform!
A-11 Effects of Metallographic and Other Preparation Techniques on
Microstructural Characterization Session Chairs:
George Vander Voort, Struers, Inc
Sidnei Paciornick, Pontificia Universidade Catolica do Rio de Janeiro, Brazil
James Martinez, NASA Johnson Space Center PlatformSession
Tuesday 1:30 PM Room: 211/212
1:30 PM 299 ~Invited! The Importance of Sample Prepara- tion in the Analysis of Powder Metallurgy (PM) Materials;T Murphy; Hoeganaes Corporation, Cinnaminson, NJ
U E S D A Y
T
2:00 PM 300 A Novel Preparartion Method for Lean Du- plex Steels; M Panzenböck, K Ragger, H Clemens; Monta- nuniversität Leoben,Austria;HChladil; Andritz Ltd, Austria
2:15 PM 301 Delineating Prior Austenite Grain Boundaries in Carbon Steels; S Lawrence; Lehigh University, Bethlehem, PA
2:30 PM 302 Obtaining Consistent Vickers Hardness at Loads=100 Grams Force; GVander Voort, R Fowler; Struers, Inc,Wadsworth, IL
A-12 Advances in Electron Crystallography for Materials Research
Session Chairs: Sergei Rouvimov, Portland State University,
Wolfgang Neumann, Humboldt University of Berlin, Germany
ChongminWang, Pacific Northwest National Laboratory Peter Moeck, Portland State University
PlatformSession Tuesday 1:30 PM Room: 201
1:30 PM 303 ~Invited! Being Quantitative in Reciprocal Space; L Marks; Northwestern University
2:00 PM 304 Transmission Diffractive Microscopy without Lenses at Visible, X-Ray and Electron Wavelengths; J Roden- burg, A Maiden, D Batey, F Sweeney, T Edo, A Hurst; University of Sheffield, United Kingdom; F Hue, PMidgley; University of Cambridge, United Kingdom; P Wang, A Kirkland; University of Oxford, United Kingdom; M Humphry; Phase Focus Ltd, United Kingdom
2:15 PM 305 ~Invited! Electron Diffraction Imaging ofMo- lecular Nanostructures and Molecular Motions; J-M Zuo, K Ran; University of Illinois, Urbana-Champaign
2:00 PM 310 Atomic Resolution at 50–300 kV Obtained using Low Dose Rate HRTEM; B Barton, C Song, C Kisielowski; Lawrence Berkeley National Laboratory
2:15 PM 311 Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Micro- scope; T Tanaka, A Takeshita; Tokyo Institute of Technology, Japan; T Kubota; Honda R&D Co, Ltd; Y Oshima; Research Center for Ultra HVEM; Y Tanishiro, K Takayanagi; Tokyo Institute of Technology, Japan
2:30 PM 312 Realization of the First Aplanatic Transmis- sion ElectronMicroscope; IMaßmann, S Uhlemann,HMuel- ler, P Hartel, J Zach,M Haider; CEOS GmbH; Y Taniguchi; Hitachi High-Technology Corporation; D Hoyle; Hitachi High-Technology Ltd; R Herring; University of Victoria, Canada
2:45 PM 313 ~Invited! From Early Days of Cold Field- Emission Electron Gun at Hitachi to Sub-Angstrom Hologra- phy; A Tonomura; Hitachi, Ltd
2:45 PM 306 Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open- Access Crystallographic Databases; P Moeck, S Rouvimov; Portland State University
3:00 PM 307 ~Invited! Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Micros- copy; P Specht; University of California, Berkeley; D Barton, J Kang, R Cieslinski; DOW Chemical Company; O Dubon; University of California, Berkeley; C Kisielowski; Lawrence Berkeley National Laboratory
P-01 A.V. CreweMemorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond
Session Chairs:
Mike Isaacson, University of California at Santa Cruz Ondrej Krivanek, Nion Co.
PlatformSession Tuesday 1:30 PM Room: 209/210
1:30 PM 308 Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipi- tates; C Ophus, A Gautam; Lawrence Berkeley National Laboratory; EMarquis; University of Michigan; U Dahmen, V Radmilovic; Lawrence Berkeley National Laboratory
1:45 PM 309 CCEREM: Critical-Convergence Extended- Resolution Electron Microscopy; M O’Keefe; OKCS; LF Al- lard; Oak Ridge National Laboratory; D Blom; University of South Carolina
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