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Wednesday AM ~Platform! 121


A-02 Opportunities and Advances for In-situ Experiments in


Electron-Optical Instruments Session Chairs:


Blythe Clark, Sandia National Laboratories


Thomas Hansen, Technical University of Denmark Nestor J. Zaluzec, Argonne National Laboratory


PlatformSession Wednesday 8:30AM Room: 208


8:30AM 462 In-Situ Catalysis with High Spatial and Tem- poral Resolution; J McKeown; Lawrence Livermore National Laboratory; SMehraeen, DMasiel; University of California, Davis; B Reed, T LaGrange; Lawrence Livermore National Laboratory; J Evans;University of California, Davis;GCamp- bell, N Browning; Lawrence Livermore National Laboratory


8:45 AM 463 Operando TEM—Detection of Gas Phase Catalysis in an Environmental TEM with EELS; S Chenna, P Crozier; Arizona State University


9:00 AM 464 In-situ Cross-sectional Observation of the Surface Phenomena ofMaterials; K Sasaki,MHattori, S Arai, K Kuroda, N Tanaka; Nagoya University


9:15AM 465 Dynamic TEM Observation of Gold Nanopar- ticles during Catalytic Reactions at Ambient Pressure;T Ka- wasaki, T Miura, Z Cui, T Tanji; Nagoya University


9:30 AM 466 Elevated Temperature Observation of Selec- tive Oxidation Catalyst M1 Along [001]; D Blom; University of South Carolina; LF Allard; Oak Ridge National Labora- tory;WBigelow; University of Michigan


9:45 AM 467 Redox Reactions in an YSZ/Pt Interface—An In-situ Electron Holography and EELS Study; AH Tavabi, T Tanji; Nagoya University


10:00 AM Coffee Break


10:30 AM 468 In-situ TEM Study of Sintering of Capped Silver Nanoparticles; M Asoro, D Kovar, P Ferreira; Univer- sity of Texas, Austin


10:45 AM 469 In-situ TEM Observation of Synthesizing Long Gold Atom Strand; Y Oshima; Oska University; Y Kurui, K Takayanagi; Tokyo Institute of Technology


11:00 AM 470 The Use of Ag-Au Alloy Catalysts to Control the Growth Mode for Si Nanowires; Y-C Chou; Purdue University; M Reuter; IBM T J Watson Research Center; E Stach; Purdue University; F Ross; IBM T JWatson Research Center


11:15AM 471 In Situ Probing of Structural and Electrome- chanical Properties of an Individual ZnO Nanobelt; A Ast- hana, K Momeni, A Prasad, YK Yap, RS Yassar; Michigan Technological University


9:30 AM 478 ~Invited! Quantitative Electron Probe Micro- analysis at Age 60: A Still Vibrant and Evolving Nanoanalyti- calMethod Fulfilling Castaing’sVision; J Armstrong; Carnegie Institution of Washington


10:00 AM Coffee Break


10:30 AM 479 ~Invited! Energy Dispersive Spectrometry at Wavelength Precision; N Ritchie, D Newbury, J Davis; Na- tional Institute of Standards and Technology


11:00AM 480 ~Invited! Is SEM/EDS Quantitative?;DNew- bury, N Ritchie; National Institute of Standards and Technology


11:30 AM 481 ~Invited! High Sensitivity EPMA: Past, Present and Future; J Donovan; University of Oregon


11:30 AM 472 Electron-beam Induced Crystallization of Al2O3 Film Generated from Inorganic Aqueous Precursors;S Xie; University of Oregon; W Wang, D Keszler; Oregon State University


11:45AM 473 In Situ TEM Studies of Nanoparticle Growth in a Fluorozirconate (ZBLAN) Glass Matrix;M Vu;Univer- sity of Tennessee, Tullahoma; C Alvarez; Northwestern Uni- versity;Y Liu,A Petford-Long;ArgonneNational Laboratory; J Johnson; University of Tennessee, Tullahoma


A-03Microanalysis at 60 Years: A Symposium Dedicted to Raimond Castaing


Session Chairs:


Paul Carpenter,Washington University Ron Gauvin,McGill University Ed Vicenzi, Smithsonian Institution


John Fournelle, University of Wisconsin PlatformSession


Wednesday 8:00AM Room: 204


8:00 AM 474 The Legacy of Raimond Castaing: A Perspec- tive at 60 Years; P Carpenter; Washington University; E Vicenzi; Smithsonian Institution; R Gauvin;McGill Univer- sity; J Fournelle; University of Wisconsin


8:15 AM 475 ~Invited! Accuracy of Quantitative EPMA Models at Low Voltages; C Merlet; Université Montpellier II; X Llovet; Universitat de Barcelona, Spain


8:45 AM 476 60 Years after Castaing’s Thesis, What Re- mains to Be Done?; R Gauvin;McGill University


9:00 AM 477 ~Invited! Quantitative Electron Probe Micro- analysis at Low andMultiple Voltages; X Llovet; University of Barcelona Spain; C Merlet; University of Montpellier II


W E D N E S D A Y


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