Wednesday PM ~Platform! 129


2:15 PM 602 ~Invited! Practical Remote Electron Micros- copy—A Vendor’s Perspective; T Isabell, N Erdman, V Rob- ertson, I Ishikawa; JEOL USA; K Somehara, T Nakamichi; JEOL Ltd, Japan


2:45 PM 603 Advanced Microscopic Characterisation through Integrated Learning Tools; B Cribb, TWhite, J Shap- ter, J Muhling, L Soon, S Ringer, E Grinan, C Frost, P Munroe; AustralianMicroscopy andMicroanalysis Research Facility, Australia


3:00 PM 604 On-Line Scanned ProbeMicroscopy Transpar- ently Integrated with Twin SEM/FIB Systems; A Lewis; He- brew University of Jerusalem, Israel; A Ignatov, A Komissar, H Taha; Nanonics Imaging Ltd, Israel; E Maayan; Nanonics Imaging Ltd, Israel


3:15 PM 605 Remote Viewing of SEM—AVersatile Tool for Failure Analysts and the Materials Community; C Shah; Exova Inc


A-14 Equipment Funding Opportunities & Strategies for Success


Session Chairs: Owen Mills;Michigan Institute of Technology


Christopher Gilpin; University of Texas Southwestern PlatformSession


Wednesday 1:30 PM Room: 109


1:30 PM 606 The Challenges of Obtaining Funding for Major Instrumentation; D Sherman; Purdue University


1:45 PM 607 Competitive Proposals for Major Research Instrumentation Program of NSF: Tips and Facts; R Shahba- zian Yassar;Michigan Technological University


2:00 PM 608 Building a New Microscopy Center at Miami University; R Edelmann,M Duley;Miami University


2:15 PM Roundtable Panel Discussion, and Presentations from Representatives from ONR, NSF, and NIH


P-02 Structural and Physical Properties of Thin Films, Interfaces, and Grain Boundaries


Session Chairs:


Klaus Van Benthem, University of California, Davis Naoya Shibata, University of Tokyo, Japan


PlatformSession Wednesday 1:30 PM Room: 206


1:30 PM 609 High Resolution Investigation on the Struc- ture of Quantum Wells in the System CdSe-ZnSe; H Cal- deron; Escuela Superior de Fisica y Matemáticas, Mexico; I Hernandez-Calderon; CINVESTAV,Mexico


1:45 PM 610 Interfacial Chemistry, Defects, and Strain in Multiferroic Heterostructures; J Sloppy; Drexel University; J Idrobo; Oak Ridge National Laboratory; S Sundaram; The University of New South Wales; S Spurgeon, C Winkler; Drexel University; NValanoor, PMunroe; The University of New SouthWales;M Taheri; Drexel University


2:00 PM 611 Stress Distribution inMultiple QuantumWell Stacks and Its Effect on Optical Emission EnergyUsing Cathod- oluminescence in a STEM; A Mouti, P Stadelmann; Swiss Federal Institute of Technology, Lausanne


2:15 PM 612 Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM;AYankovich,A Kvit;University ofWiscon- sin, Madison; X Li, F Zhang, V Avrutin, H Liu, N Izyum- skaya, U Ozgur, H Morkoc; Virginia Commonwealth University; P Voyles; University of Wisconsin,Madison


2:30 PM 613 Measuring Strain in AlN/GaN Superlattices and Nanowires by NanoBeam Electron Diffraction; C Bou- gerol; CNRS, France; A Béché; FEI Company, The Nether- lands; B Daudin, J-L Rouvière; CEA-Grenoble, France


2:45 PM 614 Investigation of the GaP/Si Interface by High- Resolution Scanning Transmission Electron Microscopy;A Beyer, J Ohlmann; Philipps-University Marburg, Germany; M Luysberg; Ernst Ruska-Centre for Microscopy and Spec- troscopy with Electrons, Forschungszentrum Jülich GmbH; K Volz; Philipps-University Marburg, Germany


3:00 PM 615 Low Temperature Synthesis of Zn3P2 Nano- wire; I-T Bae, D Van Hart; SUNY Binghamton


W E D N E S D A Y


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