Pre-meeting Sunday Short Courses 23


X-14 3D ELECTRON MICROSCOPY OF MACROMOLECULAR ASSEMBLIES ORGANIZER: TERESA RUIZ,MICHAEL RADERMACHER, AND STEFAN BIRMANNS 8:30 AM–5:00 PM, ROOM 108


This short course will provide a comprehensive description of the methods used for 3D structure determination of macromolecular complexes fromelectron micrographs. First specimen preparation techniques for single particles ~deep stain, vitreous ice! will be presented and the selection of imaging conditions including low-dose imaging. This will be followed by a detailed explanation of image processing techniques with special emphasis on the random conical reconstruction technique. In the last part structure interpre- tation and docking of X-ray structures to 3D EM densities will be demonstrated. The techniques described have appli- cation in both biological and materials science.


Multi-Disciplinary


X-15 ADVANCED TOPICS IN THE THEORY AND USE OF FOCUSED ION BEAM TOOLS ORGANIZERS: JOE MICHAEL AND LUCILLE GIANNUZZI 8:30 AM–5:00 PM, ROOM 109


The use of single platform FIB and dual platform FIB/SEM instruments in materials and biological science laboratories is growing rapidly. The versatility and the capabilities of these tools are also rapidly improving. This course will first cover ion/solid interactions that are so important for a user of FIB instrumentation to understand.We will then discuss techniques of sample preparation for SEM and TEM. The course will conclude with discussions of 3D applications and nanofabrication.


X-16 ELECTRON TOMOGRAPHY IN LIFE AND MATERIAL SCIENCES ORGANIZERS: ILKE ARSLAN AND ANDY HOENGER 8:30 AM–5:00 PM, ROOM 110/111


This short course will explain the basics of tomography, the experimental setups, and the instrumental prerequisites, illustrated by application examples. Bright-field, energy- filtered, and STEM tomographic methods will be discussed, emphasizing high resolution for materials applications, and


low-dose cryo imaging for biological applications. A variety of reconstruction algorithms will be covered, as well as a survey of 3-D analysis and visualization methods. We in- tend the course to be of interest to both beginners and already-experienced users of electron tomography.


X-17 IMAGING AND ANALYSIS WITH VARIABLE PRESSURE OR ENVIRONMENTAL SEM ORGANIZERS: BRENDAN J. GRIF FIN AND MATTHEW PHILLIPS 8:30 AM–5:00 PM, ROOM 201


This short course aims to take the challenge out of imaging in variable pressure SEM mode.We will sequentially address VPSEM column components and operation, electron ~SE and BSE!, light ~CL! imaging, and X-ray analysis strategies and detectors for both biological and materials samples. Procedures for monitoring instrument performance and optimizing image quality will then be presented. Examples of the novel charge-related contrasts available in VPSEM will also be discussed. The appropriate use of hot, cool, and cold stages is included. The course will conclude with in- vited manufacturer presentations on new developments. A CD with lecture PDFs is provided.


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