138 Thursday AM ~Platform! Thursday, August 11, 2011
A-03Microanalysis at 60 Years: A Symposium Dedicted to Raimond Castaing
Session Chairs: Paul Carpenter,Washington University Ron Gauvin,McGill University Ed Vicenzi, Smithsonian Institution
John Fournelle, University of Wisconsin PlatformSession
Thursday 8:00AM Room: 204
8:00 AM 749 On the Performance of XEDS and EELS in the AEM: 25 Years Later; N Zaluzec; Argonne National Laboratory; H Fraser; The Ohio State University; D Klenov; FEI-Eindhoven; Y-CWang, H Cheng; FEI-Hillsboro
8:15 AM 750 X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials; D Meier, J Davis, A Konicek; National Institute of Standards and Technology; E Vicenzi; Smithsonian Institution; SWight; National Insti- tute of Standards and Technology
8:30 AM 751 Multivariate Statistical Analysis of STEM- EDS at the Noise Floor; C Parish, P Edmondson, M Miller; Oak Ridge National Laboratory
8:45 AM 752 High Resolution Imaging and X-Ray Micro- analysis in the FE-SEM; R Gauvin, N Brodusch, P Michaud; McGill University; L Rodrigue, M Trudeau; Hydro-Québec Research Institute
9:00 AM 753 ChemicalMapping at the Atomic Level Using Energy Dispersive X-Ray Spectroscopy; B Freitag, D Klenov, S von Harrach; FEI Company; A D’Alfonso, L Allen; Univer- sity of Melbourne
9:15AM 754 Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM; D Hodoroaba; BAM Federal Institute for Materials Research & Testing; T Salge, R Terborg; Bruker Nano;V Rackwitz; BAMFederal Institute for Materials Research & Testing
H U R S D A Y
T
9:30 AM 755 Quantification of Grain Boundary Segrega- tion Monolayers by X-Ray Spectroscopy in a Scanning Elec- tron Microscope; P Nowakowski, F Christien, M Allart, Y Borjon-Piron, R Le Gall; University of Nantes; J-C Menard; Carl Zeiss NTS sas; H Mantz; Carl Zeiss NTS GmbH
9:45 AM 756 An Extension up to 4 keV by a Newly Devel- opedMultilayer-Coated Grating for TEM-SXES Spectrometer; MTerauchi; IMRAM, Tohoku Univ;H Takahashi,N Handa, TMurano; JEOL;MKoike, T Kawachi, T Imazono,N Hasa- gawa; Japan Atomic Energy Agency;MKoeda, T Nagano, H Sasai,Y Oue, Z Yonezawa, S Kuramoto; SHIUMADZU
8:00 AM 757 ~Invited! Importance of the Protective Layers and the Specimen Preparation for Reproducible APT Results; S Mutas, C Klein; Globalfoundries Dresden, Germany
8:30 AM 758 ~Invited! Application of Atom Probe Tomog- raphy in Understanding Thin Film Chemical Ordering and Stress Behavior; G Thompson, B Fu, D Means, B Wang; University of Alabama
9:00AM 759 ResolvingNanostructures in Complex Penetra- tive Oxidation for Ni-30Cr Alloys Exposed to High- Temperature Water Using APT and TEM; M Olszta, L Thomas, S Bruemmer; PacificNorthwestNational Laboratory
9:15 AM 760 ~Invited! Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires;D Diercks;University of North Texas; CL Cheung, J Brewer; University of Nebraska-Lincoln
9:45 AM 761 Complimentary Chemical Imaging of Au- Nanoparticles Embedded in MgO Using Laser Assisted Atom Probe Tomography; S Kuchibhatla; Pacific Northwest Na- tional Laboratory; V Shutthanandan, B Arey; Pacific North- west National Laboratory; T Prosa; Cameca Instruments Inc; P Adusumilli; Northwestern University; R Ulfig; Cam- eca Instruments Inc; CWang, S Thevuthaasan; PacificNorth- west National Laboratory
A-05 Advancing Data Collection and Analysis for Atom Probe Tomography
Session Chairs:
Gregory Thompson; University of Alabama David Larson; Cameca Instruments, Inc.
PlatformSession Thursday 8:00AM Room: 205
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