Thursday AM ~Platform! 139
A-12 Advances in Electron Crystallography forMaterials Research
Session Chairs: Sergei Rouvimov, Portland State University
Wolfgang Neumann, Humboldt University of Berlin, Germany
ChongminWang, Pacific Northwest National Laboratory Peter Moeck, Portland State University
PlatformSession Thursday 8:00AM Room: 201
8:00 AM 762 ~Invited! Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy; E Rauch; SIMAP Grenoble, France; K Barmak; Carnegie Mellon University; J Ganesh; University of Texas, Austin; P Ferreira; University of Texas, Austin; A Darbal, D Choi; Carnegie Mellon University; T Sun, B Yao, K Coffey; University of Central Florida; S Nicolopoulos; NanoMEGAS SPRL, Belgium
8:30 AM 763 Microstructure Characterization of Surface Modified 316L Stainless Steel Using an Automated Electron Diffraction Technique in the TEM; G Facco, A Kulovits, J Wiezorek; University of Pittsburgh
8:45 AM 764 ~Invited! D-STEM Combined with Preces- sion Microscopy for Nanoscale Crystal Orientation and Phase Mapping; K Ganesh, S Rajasekhara; University of Texas, Austin;D Bultreys;NanoMEGAS, Belgiuj; KHattar, J Knapp; Sandia National Laboratory; P Ferreira; University of Texas, Austin
9:15 AM 765 ~Invited! In-situ Observations of the Com- plex Crystallization Processes Occurring Laser Heated Amor- phous Germanium Films; T LaGrange; Lawrence Livermore National Laboratory; L Nikolova; Institut National de la Recherche Scientifique, Canada; M Wall, B Reed, G Camp- bell; Lawrence Livermore National Laboratory; B Siwick; McGill University, Canada; F Rosei; Institut National de la Recherche Scientifique, Canada
9:45AM 766 Measurement of Nanograin Orientations: Ap- plication to Cu Interconnects and Nanoparticle Phase Identi- fication; G Brunetti, J-L Rouvière; CEA Grenoble, France; R Galand, L Clément; STMicroelectronics, France; C Cayron; CEA Grenoble, France; E Rauch; Université de Grenoble, France; D Robert, J-F Martin, F Bertin, A Chabli; CEA Grenoble, France
A-13Microscopy,Microanalysis, and Image Analysis in the Pharmaceutical Sciences and Diagnostic Microscopy
Session Chairs:
Andrew Vogt, Abbott Labs Cindy Smith, Nephropath
Phoebe Stewart, Vanderbilt University
KarenWeidenheim, Albert Einstein College of Medicine PlatformSession
Thursday 8:00AM Room: 105/106
8:00AM 767 ~Invited! X-Ray Tomography Generates Quan- titative, 3-D Views of Intact Cells; C Larabell, M Uchida, G McDermott, C Knoechel;University of California, San Fran- cisco;MWetzler, A Barron; Stanford University;MLe Gros; Lawrence Berkeley National Laboratory
8:30 AM 768 ~Invited! Practice of Kidney Biopsy Pathology 2011; A Fogo; Vanderbilt University
9:00 AM 769 ~Invited! Mouse Models of Brain Cancer: Insight into the Cytopathogenesis of Glioma; S Ghazi, M Stark, P Li, H Moses, T Abel; Vanderbilt University Medical Center
9:30 AM 770 30 Years of Transmission Electron Microscopy (TEM) at theWyoming State Veterinary Laboratory, Laramie, WY as an Aid for Viral Diagnosis; C Hearne, J Cavender, M Miller; University of Wyoming
9:45 AM 771 Ethylene and Structure-Function Relations of Xylella fastidiosa in Vitis Vinifera in Pierce’s Disease in Plants; EA Ellis, BG Cobb; Texas A&M University
P-02 Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries
Session Chairs:
Klaus Van Benthem, University of California at Davis Naoya Shibata, University of Tokyo, Japan
PlatformSession Thursday 8:15AM Room: 206
8:15 AM 772 ~Invited! Line Defects at Interfaces in Telluride-Based ThermoelectricMaterials; DMedlin, J Sugar; Sandia National Laboratories; N Heinz, T Ikeda, G Snyder; California Institute of Technology
8:45 AM 773 Characterizing Texture and Grain Bound- aries in Nanoscale Cu Interconnects by Precession Electron Diffraction; J Kameswaran; University of Texas, Austin; A Darbal; Carnegie Mellon University; S Rajasekhara; Univer- sity of Texas, Austin; G Rohrer, K Barmak; Carnegie Mellon University; P Ferreira; University of Texas, Austin
9:00 AM 774 In Situ TEM Investigation of Electrical Cur- rent Effect ON Aluminum Interconnect; D Xie, Z Shan; Xian Jiaotong University
H U R S D A Y
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