This page contains a Flash digital edition of a book.
Thursday AM ~Platform! 139


A-12 Advances in Electron Crystallography forMaterials Research


Session Chairs: Sergei Rouvimov, Portland State University


Wolfgang Neumann, Humboldt University of Berlin, Germany


ChongminWang, Pacific Northwest National Laboratory Peter Moeck, Portland State University


PlatformSession Thursday 8:00AM Room: 201


8:00 AM 762 ~Invited! Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy; E Rauch; SIMAP Grenoble, France; K Barmak; Carnegie Mellon University; J Ganesh; University of Texas, Austin; P Ferreira; University of Texas, Austin; A Darbal, D Choi; Carnegie Mellon University; T Sun, B Yao, K Coffey; University of Central Florida; S Nicolopoulos; NanoMEGAS SPRL, Belgium


8:30 AM 763 Microstructure Characterization of Surface Modified 316L Stainless Steel Using an Automated Electron Diffraction Technique in the TEM; G Facco, A Kulovits, J Wiezorek; University of Pittsburgh


8:45 AM 764 ~Invited! D-STEM Combined with Preces- sion Microscopy for Nanoscale Crystal Orientation and Phase Mapping; K Ganesh, S Rajasekhara; University of Texas, Austin;D Bultreys;NanoMEGAS, Belgiuj; KHattar, J Knapp; Sandia National Laboratory; P Ferreira; University of Texas, Austin


9:15 AM 765 ~Invited! In-situ Observations of the Com- plex Crystallization Processes Occurring Laser Heated Amor- phous Germanium Films; T LaGrange; Lawrence Livermore National Laboratory; L Nikolova; Institut National de la Recherche Scientifique, Canada; M Wall, B Reed, G Camp- bell; Lawrence Livermore National Laboratory; B Siwick; McGill University, Canada; F Rosei; Institut National de la Recherche Scientifique, Canada


9:45AM 766 Measurement of Nanograin Orientations: Ap- plication to Cu Interconnects and Nanoparticle Phase Identi- fication; G Brunetti, J-L Rouvière; CEA Grenoble, France; R Galand, L Clément; STMicroelectronics, France; C Cayron; CEA Grenoble, France; E Rauch; Université de Grenoble, France; D Robert, J-F Martin, F Bertin, A Chabli; CEA Grenoble, France


A-13Microscopy,Microanalysis, and Image Analysis in the Pharmaceutical Sciences and Diagnostic Microscopy


Session Chairs:


Andrew Vogt, Abbott Labs Cindy Smith, Nephropath


Phoebe Stewart, Vanderbilt University


KarenWeidenheim, Albert Einstein College of Medicine PlatformSession


Thursday 8:00AM Room: 105/106


8:00AM 767 ~Invited! X-Ray Tomography Generates Quan- titative, 3-D Views of Intact Cells; C Larabell, M Uchida, G McDermott, C Knoechel;University of California, San Fran- cisco;MWetzler, A Barron; Stanford University;MLe Gros; Lawrence Berkeley National Laboratory


8:30 AM 768 ~Invited! Practice of Kidney Biopsy Pathology 2011; A Fogo; Vanderbilt University


9:00 AM 769 ~Invited! Mouse Models of Brain Cancer: Insight into the Cytopathogenesis of Glioma; S Ghazi, M Stark, P Li, H Moses, T Abel; Vanderbilt University Medical Center


9:30 AM 770 30 Years of Transmission Electron Microscopy (TEM) at theWyoming State Veterinary Laboratory, Laramie, WY as an Aid for Viral Diagnosis; C Hearne, J Cavender, M Miller; University of Wyoming


9:45 AM 771 Ethylene and Structure-Function Relations of Xylella fastidiosa in Vitis Vinifera in Pierce’s Disease in Plants; EA Ellis, BG Cobb; Texas A&M University


P-02 Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries


Session Chairs:


Klaus Van Benthem, University of California at Davis Naoya Shibata, University of Tokyo, Japan


PlatformSession Thursday 8:15AM Room: 206


8:15 AM 772 ~Invited! Line Defects at Interfaces in Telluride-Based ThermoelectricMaterials; DMedlin, J Sugar; Sandia National Laboratories; N Heinz, T Ikeda, G Snyder; California Institute of Technology


8:45 AM 773 Characterizing Texture and Grain Bound- aries in Nanoscale Cu Interconnects by Precession Electron Diffraction; J Kameswaran; University of Texas, Austin; A Darbal; Carnegie Mellon University; S Rajasekhara; Univer- sity of Texas, Austin; G Rohrer, K Barmak; Carnegie Mellon University; P Ferreira; University of Texas, Austin


9:00 AM 774 In Situ TEM Investigation of Electrical Cur- rent Effect ON Aluminum Interconnect; D Xie, Z Shan; Xian Jiaotong University


H U R S D A Y


T


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136  |  Page 137  |  Page 138  |  Page 139  |  Page 140  |  Page 141  |  Page 142  |  Page 143  |  Page 144  |  Page 145  |  Page 146  |  Page 147  |  Page 148  |  Page 149  |  Page 150  |  Page 151  |  Page 152  |  Page 153  |  Page 154  |  Page 155  |  Page 156  |  Page 157  |  Page 158  |  Page 159  |  Page 160  |  Page 161  |  Page 162  |  Page 163  |  Page 164  |  Page 165  |  Page 166  |  Page 167  |  Page 168  |  Page 169  |  Page 170  |  Page 171  |  Page 172  |  Page 173  |  Page 174  |  Page 175  |  Page 176  |  Page 177  |  Page 178  |  Page 179  |  Page 180  |  Page 181  |  Page 182  |  Page 183  |  Page 184  |  Page 185  |  Page 186  |  Page 187  |  Page 188  |  Page 189  |  Page 190  |  Page 191  |  Page 192  |  Page 193  |  Page 194  |  Page 195  |  Page 196  |  Page 197  |  Page 198  |  Page 199  |  Page 200  |  Page 201  |  Page 202  |  Page 203  |  Page 204