104 Tuesday AM ~Platform!
11:30 AM 201 ~Invited! Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Elec- tron Microscopic Tomography and Serial Block Face SEM;M Ellisman, T Deerinck, E Bushong, J Bouwer, T Shone, L Jin, A Milazzo, S Peltier, N-H Xuong; University of California, San Diego
A-11 Effects of Metallographic and Other
Preparation Techniques onMicrostructural Characterization
Session Chairs: George Vander Voort, Struers, Inc
Sidnei Paciornik, Pontificia Universidade Catolica do Rio de Janeiro, Brazil
U E S D A Y
T
James Martinez, NASA Johnson Space Center PlatformSession
Tuesday 9:00AM Room: 211/212
9:00 AM 202 ~Invited! Metallography as a Microanalysis Tool during the Failure Investigation of the Starboard Solar Alpha Rotary Joint of the International Space Station;V Long, M Wright, S McDanels, P Marciniak, D Lubas, B Tucker; NASA, Kennedy Space Center, FL
9:30 AM 203 Precipitation and “Sensitization”; of Type 304L Stainless Steel: Correlation of the ASTM A262 Practice A Test with Analytical Electron Microscopy;B Miller,M Burke; Bechtel Marine Propulsion Corporation,West Mifflin, PA
9:45 AM 204 Understanding the Manufacturing Process of Molybdenum 47.5% Rhenium Sheet Through Examination of Microstructures at Steps of Processing; J Johnson, T Leon- hardt; Rhenium Alloys, Inc, Elyria, OH
10:00 AM Coffee Break
10:30 AM 205 ~Invited! Image Analysis Characterization of Modern Pipe Steels Structures; A Kazakov, D Kiselev, E Kazakova, L Chigintsev; Saint-Petersburg State Polytechni- cal University, Russia
11:00 AM 206 UV Treatment of TEM STEM Samples for ReducedHydrocarbon Contamination;DHoyle;HitachiHigh- Technologies Canada, Inc, Etobicoke, Canada; M Malac; National Institute of Nanotechnology, Alberta, Canada; M Trudeau; IREQ, Quebec, Canada; P Woo; Hitachi High- Technologies Canada, Inc, Etobicoke, Canada
11:15 AM 207 Large Thin Area Preparation of Cross- Sectional TEM Specimens of III-V Semiconductors; J-G Zheng; University of California, Irvine, CA
11:30 AM 208 Metallographic Preparation Techniques for Evaluation of Co-Cr-Mo Alloys; C McNee, J Frafjord, M Mondo; IMR KHA-Portland, Portland, OR
11:45 AM 209 Metallographic Preparation of Space Shuttle Reaction Control System Thruster Electron Beam Welds for Electron Backscatter Diffraction; J Martinez, W Castner, J Figert, J Ventura, D Gonzalez; NASA Johnson Space Center, Houston, TX
P-01 A.V. CreweMemorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond
Session Chairs:
Mike Isaacson, University of California at Santa Cruz Ondrej Krivanek, Nion Co.
PlatformSession Tuesday 8:00AM Room: 209/210
8:00 AM 210 ~Invited! Single Atom Imaging and EELS; 40 Years Ago; M Isaacson; University of California at Santa Cruz
8:30AM 211 ~Invited! Chicago Exploration Days; E Zeitler; Fritz-Haber Institute,Max-Planck Society
9:00AM 212 ~Invited! Chicago Aberration CorrectionWork; V Beck; Retired
9:30 AM 213 Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries; J Aguiar; Lawrence Livermore National Laboratory;HYang;University of California Davis; M Sarahan; SuperSTEM Laboratory, Darsbury; N Brown- ing; University of California Davis
9:45 AM 214 Single-atom Sensitive Chemical and Struc- tural STEM Characterization of Two-DimentionalMoS2Nano- catalysts; Q Ramasse; SuperSTEM Laboratory, Darsbury; L Hansen, M Brorson; Haldor Topsoe, Denmark; E Johnson; University of Copenhagen; B Schaffer; SuperSTEM Labora- tory, Darsbury; C Kisielowski; Lawrence Berkeley National Laboratory; S Helveg; Haldor Topsoe, Denmark
10:00 AM Coffee Break
10:30 AM 215 ~Invited! Seeing the Atoms More Clearly: STEM Imaging from the Crewe Era to Today; S Pennycook; Oak Ridge National Laboratory
11:00 AM 216 ~MSA Presidential Student! Efficient Elas- tic Imaging of Single Atoms with Aberration-Corrected Scan- ning Transmission ElectronMicroscopy; R Hovden, DMuller; Cornell University
11:15 AM 217 Atomic-Resolution Differential Phase Con- trast Imaging by STEM; N Shibata, S Findlay, Y Ikuhara; University of Tokyo
11:30 AM 218 Atomic-scale Interaction Dynamics in Few- layer Hexagonal Boron Nitride (h-BN); N Alem; University of California, Berkeley; Q Ramasse, M Sarahan; Super- STEM, Daresbury; R Erni; EMPA, Federal Laboratories for Materials Science and Technology, Switzerland; O Yazyev, K Erickson, S Louie, A Zettl; University of California, Berkeley
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