24 Pre-meeting Sunday Short Courses


X-18 AN INTRODUCTION TO ATOMIC FORCE AND SCANNED PROBE MICROSCOPIES ORGANIZER: LOU GERMINARIO


8:30 AM–5:00 PM, ROOM 202


Atomic force microscopy ~AFM! has widespread application in all fields of science. Scanning probe microscopy ~SPM! techniques have become the workhorse of nanoscience and nanotechnology research, with resolution from atomic to millimeter scale and the ability to perform under air, liquid, or vacuum and on soft or hard materials. AFM provides topographic information and can measure mechanical, elec- trical, and magnetic, as well as performing near-field prob- ing of thermal and chemical properties. A description of AFMs in commonly-used and advanced modes of opera- tion will be provided. Examples from materials and life sciences will illustrate the capabilities and limitations of SPM techniques.


X-19 SCIENTIFIC DIGITAL IMAGING: ETHICS AND EXECUTION ORGANIZER: JOHN MACKENZIE 8:30 AM–5:00 PM, ROOM 207


There is a need for standardization in scientific digital imaging in order to ensure proper ethical manipulation. This newly designed course will include a new Handbook for Scientific Digital Imaging. This handbook presents a standardized workflow with relevant theory to help kick start the standardization discussion. Topics covered include: the proper optimization of digital images; preparation of images for Powerpoint, posters, and publication including newer enhanced on-line versions; selection of the top-rated and most affordable printers, scanners, and software; best practices for archiving scientific digital images. Step-by-step demonstrations of the best strategy for reproducible image optimization using Photoshop.


Physical Sciences


X-20 MICROSCOPY AND NANOMECHANICAL CHARACTERIZATION ORGANIZER: JULIA NOWAK 8:30 AM–5:00 PM, ROOM 208


Nanomechanical testing is a versatile technique used for measuring and evaluating the mechanical properties of ma- terials including modulus, hardness, fracture toughness,wear resistance, adhesion, and friction coefficient. This type of characterization can provide crucial information concern- ing the performance of materials.Nanomechanical testing is often combined with scanning probe microscopy and in recent years is being performed in conjunction with both transmission electron microscopy and scanning electron microscopy. In this course we will explain the fundamentals of nanomechanical testing and its role in the microscopy arena, illustrated by application examples.


X-21 ADVANCED ELECTRON CRYSTALLOGRAPHY AND AUTOMATED CRYSTAL MAPPING FOR MATERIALS APPLICATIONS ORGANIZERS: PETER MOECK,ROBERT STROUD, STAVROS NICOLOPOULOS, AND SERGEI ROUVIMOV 8:30 AM–5:00 PM, ROOM 209


The development of novel electronic materials and nano- structures requires reliable metrology for an identification of crystal phases and orientations at nano-scale. Recent progress in automated acquisition and handling of 3-dimensional electron diffraction data opens new exciting opportunities for structure analysis in fast and reliable fashion. Course will cover basic principles of electron dif- fraction and crystallography as well as advances in auto- mated data acquisition, crystal orientation and phase mapping, nano crystallographic fingerprinting, crystallo- graphic image processing and their applications for materi- als research. Both lectures and exercises on structure analysis based on the electron diffraction and electron crystallogra- phy will be included.


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