Symposia 77
A-07 MICROANALYSIS STANDARDS ORGANIZERS: HEATHER LOWERS,ERIC STEEL, AND PAUL CARPENTER
In Room 213/214 Tuesday, 8:00AM 3:30 PM Poster Session
Microanalysis standards are central to quantitative micros- copy and microanalysis and are important in the fields of EPMA, SEM, EDS, WDS, optical, and atom-probe micros- copy. Informal conversations with scientists reveal a general lack of knowledge concerning available standards and how they can be used in the modern
laboratory.Many laborato- ries utilize commercial standard mounts with unknown provenance and are commonly up to 25 years old. Analysts may not be able to demonstrate the accuracy of microana- lytical techniques used in their lab due to use of inappropri- ate standards or insufficient use of secondary standards. This session will highlight the availability of standard refer- ence materials, ongoing studies of these and other micros- copy and microanalysis standards, and issues related to their use in the laboratory. Discussions will also determine the needs of the scientific community for new standards for existing technologies as well as those needed for emerging technologies. This session forms the initial evaluation of topical materials which will be expanded in the planned MAS 2012 Topical Conference on Standards. A proposed round-robin analytical program will be initiated during 2011 with results presented at the MAS Standards TC in 2012.
A-08 REMOTE &COLLABORATIVE INSTRUMENT OPERATION FOR RESEARCH, TEACHING, AND MAINTENANCE ORGANIZERS: JOHN F. MANSFIELD AND GARY M. BROWN
In Room 208 Wednesday, 1:30 PM
Since the mid-1990s, remote microscope control or remote collaboration has been attempted by many researchers. Ini- tially, full computer control of microscope systems was in its infancy and remote operation systems required consider- able specialized hardware, a suite of custom software appli- cations, or both together. Nevertheless, these early pioneers were successful in laying the foundation for collaboratories, telepresence operation and remote teaching and learning. As we enter the second decade of the 21st century, micro- scope manufacturers have been able to take advantage of the advancements in computer technology, principally raw processor speed, to produce complex and sophisticated ap- plications for instrument control. Themuch improved speed
of the commodity Internet, in the past decade, has meant that remote operations and collaborations are now much easier for those early practitioners. However, there is still a certain degree of reticence exhibited by other members of the microscope community to embrace implementation of remote and collaborative systems. This symposium will highlight examples of research, teaching, training, service, and maintenance by remote operation and collaboratory systems in a series of invited and contributed presentations. All are welcome to present their latest activities in remote control and collaboration.
A-09 OPTIMIZING IMAGING FOR MICROANALYSIS: REALIZING THE BENEFITS OF THE NEW DETECTOR OPTIONS ORGANIZERS: BRENDAN GRIF FIN,DAVID JOY, AND DALE NEWBURY
In Room 207 Monday, 1:30 PM 3:30 PM Poster Session
Tuesday, 8:00AM and 1:30 PM This symposium will cover:
• Developments in conventional and in-lens secondary elec- tron detectors
• Comparisons between conventional and angular-selective backscattered electron detectors
• Imaging with X-rays using Silicon Drift Detectors • X-ray image resolution with field emission sources • Energy-filtered SE imaging applications for microanalysis
A-10 ADVANCES IN 3D ELECTRON MICROSCOPY ORGANIZERS: NIELS DE JONGE,CHRISTIAN KUEBEL, AND ALIOSCKA SOUSA
In Room 102 Tuesday, 8:30AM and 1:30 PM 3:30 PM Poster Session
Wednesday, 8:30AM 3:30 PM Poster Session
Three-dimensional electron microscopy ~3D EM! is used both in biology and materials science to gain insight into structure-function relationships. This symposium aims to address forefront scientific and technological developments in the field of 3D EM, including tilt-series tomography, and single particle reconstruction. Several novel methodologies have been introduced in the past decade, including, for example, the use of phase-plate technology for 3D cryo-EM, scanning transmission electron microscopy ~STEM! tomog- raphy, focal-series STEM, atom probe tomography, focused
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