March, 2015
www.us-
tech.com
Page 69
Probing Power Supplies for Use with Test Equipment Continued from page 65
ply networks for voltage dips, short interruptions, and voltage varia- tions. This standard applies to elec- trical and electronic equipment hav- ing a rated input current not exceed- ing 16A per phase, for connection to 50 or 60Hz AC networks. The standard describes three
different tests: l
den reduction in voltage to lower voltages for a short period of time, followed by recovery to the original voltage.
Voltage dips are defined as a sud-
exceeding one minute, followed by recovery to the original voltage. Short interruptions can be consid- ered as voltage dips to 0V.
l Voltage variations are gradual
changes of the supply voltage to a higher or lower value than the rated voltage. The duration can be short or long.
The capability of a power supply l Short interruptions are defined as
a disappearance of AC voltage for a short period of time, typically not
Scan Testing Continued from previous page
Software to the Next Step Once the boundary-scan appli-
cations have run, and assuming they have run satisfactorily, the test man- agement software proceeds to the next steps in a pre-programmed sequence. For example, the test sequence
may include a set of functional tests, such as temperature profiling, para- metric measurements, electromech - anical verification, etc. If the bound- ary-scan tests detect failures, then scan diagnostics and possibly visual- ization tools will direct a repair to the point(s) of failure. If in-system programming only is also required, these steps can be performed follow- ing structural testing. There are a number of advan-
tages to be derived from combining boundary-scan and functional testing within a test system, including a reduction in the number of process steps and a simplified product flow: a single stop for structural and func- tional testing with efficient in-sys- tem programming; a saving of facto- ry floor space through the integra- tion; and reduced training require- ments for test personnel by using a uniform user interface.
Compact Footprint Boundary-scan offers a compact
footprint, high performance, and broad availability of instrument types, including compact modular PXI(e)-based boundary-scan instru- ments. Typical boundary-scan in - stru ments allow as many as four individual targets to be tested and programmed. For high-volume pro- duction requirements, multiple boun dary-scan controllers can be deployed, all running from a common test/programming source. Testing is too often considered a
part of manufacturing with no value- added component. However, this view- point ignores the real and substantial savings that can be realized with a well-conceived manufacturing test strategy. The test strategist should consider the life-cycle issues described here in which measurable cost savings can be achieved by use of boundary- scan, and which can be enhanced by combination with functional test. Contact: JTAG Technologies,
111 N. West St., Suite A, Easton, MD 21601 % 877-367-5824 or 410- 770-4415 fax: 410-770-4774 E-mail:
info@jtag.com Web:
www.jtag.com r
Boundary-
Simplimatic Simplifies Electronic Assembly.
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to continue to operate during dips in input (mains) voltage and interrup- tions again ensures that the equip- ment where it is used will also contin- ue to function through these anom- alies, minimizing any downtime. These voltage dips and interruptions vary in magnitude and length.
Holdup Time Power supplies that have high-
er levels of holdup time perform the best when subjected to these voltage dips and interruptions. They are capable of functioning through them, without output voltage deviation. Power supplies with short holdup times will typically shut down and restart during these dips. An equip- ment designer must understand the operational nature of the equipment to determine if an intermittent shut- down is acceptable. Engineers designing test equip-
ment face many challenges when choosing a power supply for their end equipment. External influences on
the systems and circuits that per- form the data sampling and meas- urement tasks in test equipment can adversely affect the function of those circuits, requiring equipment design- ers to spend additional time develop- ing shielding solutions for these cir- cuits. The TU425 series power-sup- ply models were designed for such challenges. Their high performance levels in terms of output noise, EMI, and EMC can make the job of a test- equipment designer considerably easier. Contact: SL Power Electronics
Corp., 6050 King Dr., Ventura, CA 93003 % 800-235-5929 fax: 805-832- 6135 E-mail:
info@slpower.com Web:
www.slpower.com r
Cimtrak®
line equipment from Simplimatic
Automation includes: Edge Belt Conveyors Assembly & Inspection Workstations Board Stackers & Destackers Magazine Loaders & Unloaders Lift & Shuttle Gates Turn & Orientation Units Laser Markers Buffering & FIFO Units Plus 23 Other Systems Designed to Simplify For the complete line of Cimtrak®
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Simplimatic.com
800.294.2003 Made in the USA since 1965.
Sales@Simplimatic.com Simplimatic.com Keep it Smart. Keep it Simple.™
Simplimatic Electronics Conveyor Systems
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