September, 2022
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X-Ray Inspection is Critical for Counterfeit Detection
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important layer in inspection and increases the level of due diligence.
X-Ray Inspection X-ray inspection reveals the different
internal constructions and die sizes often found in altered counterfeit product. Product with the same lot or date code should always have consistent internal construction. X-ray inspection provides the ability to detect inconsistencies quickly while verifying con- sistent construction. When inspecting unaltered counterfeit
product, the X-ray machine is an extremely valuable tool. For example, factory rejects may include product without die, missing bond wires, or damaged bond wires. By measuring and recording die sizes of known good devices, historical data can be used to detect cloned devices using non-authentic die. Eval - uating construction consistency and integrity is a key factor in the detection process. As the number of internal
inspections increases, so does the number of images to manage. Having the ability to search his- tories for comparisons to previ- ous images creates a powerful reference tool. When selecting a picture management tool, the ability to add searchable key- word tags and labels is a key fea- ture to consider. Abstract Electronics has
more than 10 years’ worth of images, resulting in more than 20 thousand images that can be searched by any combination of part number, manufacturer, ven- dor type, inspection number, PO number, date code, and known good status. Color coded labels quickly identify the inspection result of the picture. A searchable image management tool designed to manage a volume of images is an important part of any counter- feit detection program.
Choosing X-Ray To help Abstract select the
most appropriate X-ray system, they spoke with the knowledge- able and experienced people at Glenbrook Technologies and dis- cussed their needs. They learned the importance of resolution and zoom in day-to-day inspections. After many informative conver- sations and a sampling of images using different machines with various specification levels, the company selected Glenbrook’s Jewel Box 70T with a 10-micron focal spot having both mechani- cal and optical zoom, with GTI- 5000 software. The performance of this rea-
sonably priced machine has met all of Abstract’s X-ray needs to date and has allowed it to detect anom- alies and attributes which were previously undetectable. The com-
See at SMTA Guadalajara, Booth 420
pany has found die identifiers embedded in lay- ers that even decapsulation could not detect. This one piece of equipment made Abstract a better and more capable company. X-ray inspection is a valuable tool that
enables Abstract Electronics to detect and doc- ument hidden anomalies in semiconductors and integrated circuits. This due diligence is a critical step in detecting and removing counter- feit products from the supply chain. Contact: Glenbrook Technologies,
X-ray image showing inconsistent construction.
11 Emery Avenue, Randolph, NJ 07869 % 973-361-8866 E-mail: szweig@glenbrook-
tech.com Web:
www.glenbrooktech.com r
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