Mass Spectrometry & Spectroscopy 9 New 5th Generation Rigaku MiniFlex Benchtop X-ray Diffractometer (XRD)
The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximise flexibility in a benchtop package.
Ideally-suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximises sensitivity by optimising peak-to- background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value:
• New 5th generation design for 2012 • Compact, fail-safe radiation enclosure • Incident beam variable slit • Simple installation and user training • Factory aligned goniometer system • Laptop computer operation
Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameters method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.
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New Benchtop WDXRF Elemental Analyser: Supermini200
As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the all new Rigaku Supermini200 uniquely delivers low cost-of- ownership (COA) with high resolution and lower limits- of-detection (LLD).
Not only is the new Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.
Analysing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is the instrument's core competency. Rigaku Supermini200 delivers high sensitivity for light elements with superior spectral resolution for resolving line overlaps in a complex matrices without the need for deconvolution. Analysing low concentration levels of light elements (O, F, Na, Mg, Ca, Si, Al, and P) is easy.
Supermini200 is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.
EZ Analysis is a new feature that makes every day routine operation simpler. A single interface contains everything you need to know about the status of your samples, what your data measurement parameters are, what your data analysis parameters are, and a running output of your results. EZ Scan allows you to analyse unknown samples without any prior setup and with only a few clicks of the mouse to get started. Combined with Rigaku’s SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for various atmospheres, impurities and sample film.
Increased accuracy is achieved using a matching library.
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INTERNATIONAL LABMATE - JANUARY/FEBRUARY 2013 - ADVERTORIAL
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