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www.us-
tech.com Critical Inspection and Measurement:
The Convergence of the Semiconductor and SMT Markets
to begin to merge. Main drivers are very high-end electronics and semi- conductors. Chip stacking, miniatur- ization of components, silicon sur- faces, and reflective components are beginning to play a role in electronics. An exciting aspect is that
T
Fortune 100 companies, high-end smartphone companies, high-end electronics manufacturing companies, and semiconductor fabs are all unhap- py with the solutions available today for inspection and measurement. This is fertile ground for those of us who can address these challenges.
Inspection and Measurement Customers want more than
inspection and a pass/fail report. What they really need to know is point-to-point distance and line-to- line distance. They are asking ques- tions that historically the electronics industry or even the backend of the semiconductor industry had not asked previously. Now, manufacturers are seek-
CyberOptics’ three-micron sensor can deliver precise inspection and resolution for features down to 30 microns in size.
They are considering what they feed back to their processes and how they can better control their processes.
The industry dynamics are creating a real need for highly accurate 3D measurements, not just optical inspections, but optical measurements, at high speeds as well.
thrives. The industry dynamics are creating a real need for highly accu- rate 3D measurements, not just opti- cal inspections, but optical measure- ments at high speeds as well. This is where CyberOptics’ proprietary 3D multi-reflection suppression (MRS) sensor technology is highly valued. It is faster and more accurate than any
here is a confluence of factors leading the backend of the semi- conductor and SMT industries
By Dr. Subodh Kulkarni, President and CEO, CyberOptics Corporation This presents opportunities for
ing x/y/z measurements and deter- mining what it means for their processes if the measurement is off.
the companies with advanced tech- nologies, which is where CyberOptics
other 3D conventional technology and mitigates reflection-based meas- urement distortions for metrology- grade image quality. Customers value the combina-
tion of speed, accuracy and resolu- tion that CyberOptics offers. Customers worldwide have
been rapidly adopting the 3D MRS- enabled SQ3000™ multifunction sys- tem for AOI, SPI and CMM (coordi- nate measurements) and recognize it as a premier process control solution, particularly for the most challenging applications. The multifunction sys- tem can identify critical defects and measure critical parameters, in order to fix what can be found and control what can be measured. Ultimately, CyberOptics enables significant im - provements in yields, quality and operational efficiencies in customers’ manufacturing facilities.
Proprietary Sensor Fuels Growth
CyberOptics’ 2018 revenue in -
creased 21 percent over 2017. Fourth quarter 2018 sales of inspection and metrology systems increased 46 per- cent year-over-year. In this category, sales of 3D MRS-enabled SQ3000 AOI systems, including the SQ3000 CMM that incorporates AOI with metrology functionality, rose 40 percent year-
Continued on page 70
May, 2019
See at SMTconnect, Hall 4 Booth 346 and EWPTE, Booth 2050
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