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FRAMOS: The Value of Independent Performance Measurements


Ottawa, Ontario, Canada — The large number of manufacturers and models and the wide-ranging func- tionality available in the image pro- cessing market often make it difficult for customers to choose the right camera or image sensor for their spe- cific application. Many technical data sheets do not contain all the neces- sary information and, depending on the manufacturer, they may be based on different performance figures, which means that they cannot be compared with one another. The company carries out meas- urements in accordance with ISO


standards and the EMVA1288 stan- dard, among others. ISO standard tests always cover the entire imaging system and can therefore be used to identify the best combination of cam- era and lens for a particular customer application. Measurements are gener- ally made using the Ulbricht sphere and transmissive charts in order to assess the interaction between lenses and cameras. Standardized test charts, such as the ISO 12233 resolu- tion chart and the ISO 14524 OECF chart, can be used to evaluate infor- mation that includes the dynamic range, signal-to-noise ratio and modu-


lation transfer function (MTF)/resolu- tion. It is also possible to analyze the distortion, vignetting and chromatic aberration of the lens using additional test charts and to choose suitable products and settings. The majority of the measurements are visual and are usually simple to make, which allows the different systems to be assessed quickly. The EMVA1288 standard re -


quires cameras or sensor demo kits to be measured without a lens, which means that the sensor is illuminated directly with homogeneous light. The FRAMOS EMVA1288 measuring


FRAMOS camera and sensor kits conform to multiple standards.


the values are generally measured uniformly in electrons or photons. The measurements take some time to complete and provide a highly- detailed, clear and, most important- ly, standardized comparison between different cameras or image sensors. The ISO standard and the


EMVA1288 standard provide trans- parent, objective information and use reliable and precise measurement methods based on comparable guide- lines. Both standards offer customers objective measurements of cameras and image sensors. One of the most recent comparison tests carried out by the FRAMOS technical support team compares the latest A0135 sensor from ON Semiconductor with the per-


formance of its predecessor the A0134. Contact: FRAMOS Technologies, Inc., 57 Auriga Drive, Suite 223,


Ottawa, Ontario K2E 8B2, Canada % 613-208-1082 E-mail: info@framos.com Web: www.framos.com


Nanofocus Launches Probe Card Inspection System


McMinnville, OR — Nanofocus’ µsprint hp-opc 3000 performs optical inspection of probe cards, which are special test devices used for standard functional tests of wafers. Since wafer testing can only take place after the functional structures on a wafer are fully manufactured, dam- age of wafers during testing can cre- ate a significant economic loss. The inspection system enables


an innovative process step. As a spe- cialist for industrial 3D measuring technology, Oberhausen-based Nano - Focus AG has more than 20 years of experience in measuring and analyz- ing technical function surfaces at micro and nano dimensions. The company develops, produces and sells optical surface analysis systems for applications ranging from labora-


tory use to inline production control. Contact: NanoFocus, Inc., 1945


See us at Autotestcon, Booth 826 16:36


NE Baker Street, McMinnville, OR 97128 % 804-652-8970 E-mail: sales@nanofocus.com Web: www.nanofocus.com


device records the properties on four wavelengths: 465, 532, 630, and 848 nm. The process measures the intrin- sic parameters of the sensor, such as linearity, sensitivity, noise, non-uni- formity (DSNU, PRNU), dark cur- rent and spectral sensitivity. The layout and structure of the EMVA1288 report is predefined and


August, 2016


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