August, 2016
www.us-tech.com
Page 71 MOHR Releases TDR Cable Analyzer
Richland, WA — Although time- domain reflectometer (TDR) cable testers are prized for their ability to detect and localize cable faults and to measure cable length, until now, they have not been able to character- ize the frequency domain microwave/ RF performance of cables and con- nectors like instruments based on vector network analyzer (VNA) tech- nology. This has changed with the new CT100B TDR cable analyzer from MOHR Test and Measurement. According to the company, the
CT100B is the industry’s only high- resolution, portable TDR that pro- vides step TDR impedance wave- forms with resolution sufficient to show connector detail. It is also reported to be the industry’s first portable TDR capable of making fre- quency domain S-parameter meas- urements including return loss (S11) and cable loss/insertion loss (S21). High-resolution TDR is useful for
detecting and localizing cable faults and for characterizing cable and con- nector performance, but historically, portable TDRs have been unable to display OSL-calibrated, S-parameter measurements. The CT100B includes that capability, which makes it a ver- satile instrument. In addition to the introduction
of calibrated S-parameter measure- ments the cable analyzer improves upon its predecessor, the CT100 cable tester, in several other areas. The device has a multicore CPU with up to 300 times better CPU perform- ance and 16 times more internal memory. It has a fully-redesigned sampling engine that allows for waveforms up to 1.5 million points long. It also includes subpixel sam- pling to ensure that each detectable
cable fault is visible at every horizon- tal scale. As opposed to VNA technology,
the CT100B does not suffer from the inherent range/resolution tradeoff in the distance-to-fault (DTF) wave- forms calculated by a VNA-based instrument through the inverse fast Fourier transform (iFFT). This allows DTF measurements to be up to hundreds of times more accurate than those from a VNA with a simi-
38th
lar bandwidth. The cable analyzer acquires
impedance measurements sequen- tially over time, and it can time-win- dow features of interest, such as a connector or fault in the middle of a cable, while excluding unnecessary features. It can also directly test coaxial cables with a wide range of characteristic impedance as well as twisted-pair cable and multi-conduc- tor cable assemblies.
Finally, CT100B TDR waveforms
are not prone to calibration drift over time or temperature, unlike typical VNA instruments, which makes meas-
uring quicker and easier. Contact: MOHR Test and Measurement, LLC, 2105 Henderson Loop, Richland, WA 99354 % 888-852-0408 fax: 888-278-8037 E-mail:
info@mohrandassociates.com Web:
www.mohr-engineering.com
Annual EOS/ESD Symposium Tutorials, Workshops, & Exhibits September 11-16, 2016
Hyatt Regency Orange County Garden Grove (Anaheim), CA, USA
The EOS/ESD Symposium is focused on discussing the issues and providing the answers to elec- trostatic discharge in electronic production and assembly.
• Visit nearly 50 exhibits for the latest in ESD technology and services!
• Over 40 technical papers presenting the latest EOS/ESD technologies
• 35 tutorials for improving your knowl- edge of ESD design and control
• Learn solutions to electrostatic issues and obstacles
• Network with ESD professionals
7 workshops including a world café style workshop to discuss EOS Analysis and Diagnosis in a new interactive format
A keynote address on the Internet of things (IoT) and the need of robustness design and testing of devices
Emerging Topics: PCB Design for Real-World EMC Control, Radiated Emissions, Understanding Product and Measurement Antenna Behavior
R
Setting the Global Standards for Static Control! EOS/ESD Association, Inc.
www.esda.org
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