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August, 2016
Redefining Benchtop ATE with Mixed-Signal IO Systems
By Peter van den Eijnden, Managing Director, JTAG Technologies
aid structural board testing or in- system device programming. Howev- er, accessing the JTAG feature in a reliable and repeatable manner has always been somewhat neglected by boundary-scan technology and pro- grammable device vendors. Until recently, it has been large-
M
ly the responsibility of the end user to communicate with either the func- tional test system builder or an in- circuit test (ICT) bureau to make sure that JTAG tester hardware is “production ready.” We now see the combination of
two capabilities that makes a power- ful, adaptable and low-cost bench-top automatic test equipment (ATE) sys- tem. With the introduction of multi- function JTAG testers, such as the MIOS series from JTAG Technolo- gies, the user receives a low-cost, compact JTAG-based tester complete with mixed signal IO channels — voltage, measure, source and fre- quency. It can be embedded directly into one of several reconfigurable test fixtures and comes complete with a bed-of-nails interface. Add a power supply and any other meas- urement resources and the ATE
any digital electronics de- signs now contain some form of JTAG/boundary-scan to
hardware is complete. Control Software There remains the matter of
ments, such as GPIB and USB, serial ports, JTAG controllers and many others. Its flexibility allows easy con- struction of loops, branches, variable
JTAG device pins Finally, for those with no desire
An example of a JTAG MIOS test setup.
software to program and control this ATE architecture. Fortunately, in this area there are a number of avail- able options that suit a range of budgets. To develop and execute high-integrity JTAG tests using the MIOS hardware (e.g. scan path in- frastructure, interconnections, logic and memory clusters), in-system pro- gramming, ADC/DAC, PSU, and clock tests there are three excellent options. First, Python scripting language
— a favorite among engineers and sci- entists — comes with a host of open- source libraries to control instru-
handling, and file IO. This may re- quire more coding than some other methods, but dozens of test modules already exist for devices and logic clusters accessed by JTAG/boundary- scan. There exists even a VISA con- trol library. Next, LabVIEW is designed for
scientists with a preference for graphical icon-based programming. Developed by National Instruments, it has become a staple of the test world, especially within functional mixed-signal testers. Control icons (VIs) exist for prepared test execu- tion and also low-level control of
to undertake coding, whether graph- ical or textual, JTAG offers its ProVi- sion software. This high-level auto- generation system “sucks in” CAD data as well as device models from a supplied library, which contains tens of thousands of parts, and exports a complete test program set. The user can augment these tests with script- ed applications for ultimate flexibili- ty and fault coverage. There are also .NET, TestStand and ATEasy sup- port, along with other options, de- pending on test methods or individ- ual preferences. For hardware interfacing (fix-
tures), the open architecture of the JTAG MIOS testers allow it to be added to almost any popular cas- sette-based fixture. To date there have been successful applications created with ATX, DD Mechatronics, Ingun and MG hardware, and it is straightforward to combine this test capability with any other fixture
supplier’s equipment. Contact: JTAG Technologies,
Inc., 111 N West Street, Suite A, Easton, MD 21601 % 410-770-4415 fax: 410-770-4774 E-mail:
info@jtag.com Web:
www.jtag.com r
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