August, 2015
www.us-
tech.com
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Measuring the Evolution of Automated Semiconductor Test Continued from previous page
Semiconductor Inspection Systems
Production semiconductor test-
ing is also aided by x-ray technology, and powerful x-ray-based measure- ment systems for semiconductors like the model Xi3400 automated x- ray inspection (AXI) system from Nordson DAGE is designed for two- dimensional (2D) and three-dimen- sional (3D) inspection of solder joints and other features in packaged semi- conductors, PCBs, and electronic assemblies. The system, which can handle
board sizes as large as 508 x 450mm (20 x 18-in.), can acquire multiple images in different slice heights of a DUT during a single inspection cycle. For example, images can be acquired for the top and bottom portions of double-sided PCBs. The system makes use of patented digital tomo - -synthesis technology from Nordson DAGE and leverages the software automation technology developed at sister company Nordson YESTECH for comprehensive automated semi- conductor inspection capabilities. The system’s software, which runs on
Environments Continued from page 54
technologies such as prediction soft- ware. Oven setup and process opti- mization software may improve both productivity and quality by allowing for a more scientific and accurate approach to reflowing the assemblies under such difficult circumstances. NuVal EMS achieves high
yields and low costs by ensuring that every product it manufactures is well designed, properly laid out, and in concert with the client. Every prod- uct is thoroughly tested before going into production. Because customer service and
personalized solutions are impor- tant, NuVal EMS focuses on provid- ing customers with the highest possi- ble levels of quality and productivity. As del Valle admits: “There are
hundreds of contract manufacturers to choose from, but there are very few that do what we do: focus exclusively on the customer.” He added: “At NuVal EMS, we don’t want to just churn out products for clients we may never see again. Our focus is on developing long-standing relation- ships with clients where we become an extension of the client’s engineer- ing and operations team. We want to take on customers’ most difficult challenges and turn their product sketches into trailblazing innova- tions.” To find out more about NuVal
EMS, contact Jose del Valle, COO/ Vice President, at 14831 Myford Rd., Tustin, CA 92780; 714-544-0105, E-mail:
jose@nuval-ems.com,
www.nuval-ems.com. Contact: KIC, 16120 W.
Bernardo Drive, San Diego, CA 92127 % 858-673-6050 E-mail:
bdahle@kicmail.com Web:
www.kicthermal.com r
Reflow in Today’s Production
a 64-bit Windows® 7 operating sys- tem (OS), stores an extensive library of semiconductor package models to improve measurement flexibility and accuracy. Advanced inspection algo- rithms are used to provide complete inspection coverage with extremely low false failure rates. On a smaller scale, for those
seeking a simple-to-use 3D manual optical inspection system that is also compatible with computers having a Gigabit Ethernet port and running Windows 7, VisionMaster offers its M500™ inspection system for moni- toring the quality of solder paste printing. This highly accurate and repeatable inspection system pro- vides 0.5µm height resolution and 2µm x-y resolution. For production
board-level solder inspection at high speeds, this portable and lightweight inspection system provides fast and reliable detection of defects and can inspect solder quality on device pads as small as 01005 size. The system, which can be oper-
ated with a single click, automatical- ly scans, recognizes, and measures solder paste within the camera’s viewing range. The system employs a sensor machined from aircraft-grade aluminum and mounted on a vibra- tion-damped, ESD-resistant base. This optical semiconductor inspec- tion system uses advanced struc- tured light scanning to build height data for every pixel in the view. It relies on long-life light-emitting diodes (LEDs) for illumination and
Web references:
Advantest America (
www.advantest.com) VLSIresearch (
www.VLSIresearch.com) Marvin Test Solutions (
www.marvintest.com) National Instruments (
www.ni.com) Nordson DAGE (
www.nordsondage.com/Xi3400) VisionMaster (
www.visionmaster.com)
background lighting and an ad - vanced 3D algorithm for optical measurements. r
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