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meter (DVM). Of course, it must be installed in a proper PXI chassis, and the firm also provides the model GX7600 chassis, which is a nine-slot PXI mainframe that can accommodate as many as eight PXI instrument modules and an instrument controller module. System power is by means of a single power supply configuration capable of
ductors. The TS-900 series systems operate with the company’s ATEasy test software, which includes a large library of instrument drivers for use with additional test equipment. The software is also compatible with other leading test software tools, including LabWindows and LabVIEW soft- ware from National Instruments.
Rack-Mount Testers One of the better-known suppliers of modular
semiconductor test systems, National Instruments Corporation’s PXI-based Semiconductor Test System (STS) is available in three sizes (T1, T2, and T4) which accommodate one, two, or four 18-slot PXI chassis in 4U-high 19-in. rack-mount spaces. By employing the universal PXI approach, the semi- conductor test systems can be scaled to meet the requirements of a wide range of applications. The
The model GX7600 is a nine-slot PXI main- frame designed for flexible test solutions. (Photo courtesy of Marvin Test Solutions.)
550W. The chassis employs forced-air cooling by means of a pair of fans underneath the card cage, with a separate fan providing cooling for the sys- tem power supply. The GX7600 includes smart functions that monitor slot temperatures and sys- tem power-supply voltages and allows operators to program limits for warning and shutdown levels. The firm’s TS-900 series of PXI-based test
systems incorporate a 20-slot, 3U PXI chassis that can accommodate as many as 512 digital input/output (I/O) channels as well as analog, RF, and power-supply connections for a wide range of IC, SoC, and system-in-package (SiP) test applica- tions. These PXI systems include a self-test circuit board and test software which can verify the func- tional integrity of the system and help speed auto- mated testing for a variety of different semicon-
The model Xi3400 automated x-ray inspection (AXI) system provides 2D and 3D inspection of solder joints and other features in pack-
aged semiconductor devices. (Photo courtesy of Nordson DAGE.)
ety of system utilities, including status monitoring and system calibration. The firm’s PXI modules are impressive and
The STS is designed for full-scale semicon-
ductor production testing, and includes sta- tus monitoring and system calibration.
STS works with PXI instrument modules for AC, DC, and RF test functions, along with common sys- tem resources for digital pin connections and power supplies. It operates under the control of the firm’s reliable test software, including the LabVIEW and TestStand programs. The STS is designed for full- scale semiconductor production testing, and incor-
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cover a wide range of test functions. In the RF area, for example, PXI modules are available for signal generation, power measurements, vector signal analysis, and vector signal transceivers (VSTs). Vector signal analyzer (VSA) modules can be specified with a measurement bandwidth of 765MHz and a frequency range to 26.5GHz. The VST can provide as much as 200MHz real-time measurement bandwidth in a compact three-slot PXI module. For high-speed measurements, oscil- loscope modules are available with as much as 24- b resolution and sampling rates to 12.5G Samples/s, along with arbitrary waveform genera- tors with as much as 145MHz analog bandwidth.
Continued on next page
August, 2015
Measuring the Evolution of Automated Semiconductor Test Continued from page 51
porates system cables, a spring probe interface, a standard device interface circuit board, and a vari-
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