August, 2015
www.us-
tech.com
Page 51
Measuring the Evolution of Automated Semiconductor Test
By Jeffrey Paulownia S
uppliers of semiconductor test systems have raced to keep pace with the constant evolu-
tion of semiconductor technologies. As semiconductors have grown in density and complexity, and gained in analog and digital processing
and high-speed analog and digital ICs. It has a modular test program environment to speed the develop- ment of measurement programs. Advantest, which also manufac-
tures electron-beam lithography sys- tems for the fabrication of fine-fea- tured analog, digital, mixed-signal, and optical ICs, such as its F7000 system, was recently named to the VLSIresearch 10 Best list for the
27th consecutive year as a top-rated supplier of semiconductor test equip- ment. Many of the firm’s systems, including the T2000 system, can modify measurement capabilities through the addition of test modules. This level of flexibility has earned the system steady work in the auto- motive IC test area, especially for power ICs, including for use in hybrid electric vehicles.
PXI Based Test Systems Marvin Test Solutions offers a
wide range of PXI-based chassis and measurement modules for semicon- ductor testing, including its model TE6100 PXI module. This compact PXI module contains a dual-channel, 50MHz, 100Msamples/s DSO and spectrum analyzer combination with a transient recorder and digital volt-
Continued on page 56
The PXI-based Semiconductor
Test System (STS) is available in three sizes, referred to as T1, T2,
and T4, which accommodate one, two, or four 18-slot PXI chassis in 4U-high 19-in. rack-mount spaces.
speeds, automated test equipment (ATE) systems must follow. A cur- rent trend in semiconductor test solutions is in modular systems, notably based on PCI eXtensions for Instrumentation (PXI) architectures in which modules can be added to a mainframe chassis as more or differ- ent measurement capabilities are needed. Semiconductor test system designers have embraced such modu- lar formats and married them to the advancing capabilities of integrated computer systems to provide high- speed production ATE measurement capabilities for even the most advanced semiconductor devices. Parameters for today’s semicon-
ductors are becoming more stringent, especially with the meteoric rise in computerized systems for automotive use. To accommodate the related ele- vated temperatures and more com- plex applications, state-of-the-art testing has become increasingly sophisticated. For example, Advan - test America’s model T2000 Inte - grated Power Device Test Solution (IPS) has been applied to testing ana- log and digital integrated circuits (ICs) as well as high-density mixed-
Diverse and demanding applications in the
automotive industry have mandated more robust devices, which in turn have boosted the need for
increasingly sophisticated semiconductor testing.
signal silicon-on-insulator (SOI) devices with high-speed digital inter- faces, as being used by automotive manufacturers. Automotive electron- ics applications are increasingly diverse, as semiconductors are being developed and applied for such uses as improving fuel efficiency and reducing carbon dioxide emissions, and even at frequencies as high as 77GHz for radar-based safety sys- tems. The T2000 ATE system has pro- vided effective testing of high-voltage
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