This page contains a Flash digital edition of a book.
Innovation Award Infineon AG


Direct Drive for CoolSiC


Infineon’s CoolSiC transistor is a normally on JFET device, combining the well known low ohmic performance of high voltage SiC transistors with an extraordinary level of ruggedness since no susceptive gate oxide with questions about interface quality and lifetime is used in the component. However, the device is normally on and a way to make it familiar with system requirements must be identified. For comparable wide band gap devices like earlier JFETs or today’s normally on GaN HEMTs the traditional cascode arrangement is used. This simple concept offers by a series connection of the normally on component with a normally off low voltage silicon MOSFET (the blocking voltage of the MOSFET must exceed the voltage required to block the device) and connecting the gate of the normally on transistor with the source of the MOSFET. The concept can be easily derived from the equivalent circuit of each DMOS today.


However, this concept has some disadvantages like potential dynamic avalanche stress on the MOSFET or limited controllability of the switching slopes. Thus, a modified setup was developed at Infineon, sill being based on the series connection of the two devices, but now controlling each gate separately. To enable an easy implementation a driver IC was developed to operate the setup. In this mode, the switching is no longer performed via the MOSFET gate, but directly via the JFET. The MOSFET is passive in this configuration and just acts as a safety switch for start up or failure mode in which the original cascode idea is maintained. The concept is called Direct Drive.


The idea deals with the challenge of operating a normally on device safely under modern system aspects and securing lowest losses at the same time. It addresses as well ruggedness problems of competing solutions and requirements from the application with respect to the dv/dt control in PWM operation.


The idea extends the original cascode idea in a way that their negative points are diminished. By disconnecting the gate contact of the normally on JFET from the MOSFET source we can access the main switching devices directly for easy dv/dt control. Furthermore, the MOSFET is no longer switched in each dynamic cycle and thus, no additional MOSFET losses have to be considered. Finally, the MOSFET is not driven in each cycle into avalanche what increases the ruggedness of this circuit.


The novelty of the concept is the extended cascode concept into a direct drive mode which offers a lot of additional advantages and lowest losses combined with high operational stability. Since the control philosophy is


72 www.compoundsemiconductor.net March 2014


integrated into a corresponding driver IC the efforts on the user side is minimized, they can operate the device as they are familiar with from earlier power switches, but taking full advantage from the outstanding performance.


Kyma Technologies PVDNC AlN Templates


PVDNC AlN stands for plasma vapor deposition of nanocolumns. Kyma deposits nanocolumn AlN on silicon and sapphire substrates to create a great nucleation surface for growth of GaN devices thereupon. Device fabricators realize better (lower defect density) GaN buffer layers earlier in the buffer layer growth process. A lower defect density translates to higher thermal conductivity and presents other benefits depending on the device application.


Kyma supplies both materials and equipment for making PVDNC AlN templates, which is growing in importance in supporting GaN on sapphire based LEDs and GaN on Si power electronics.


The most difficult part of growing a GaN device on sapphire or silicon is in the initiation of the buffer layer. Kyma’s PVDNC AlN materials present the ultimate in terms of a great nucleation surface for growing GaN based devices on top of it. The PVDNC process creates a nanostructured AlN surface which is optimal to nucleate GaN growth on top. The process works on both flat and patterned substrates. PVDNC puts an important nanostructure on top of flat or microstructured substrates.


PVD was thought to be a low-tech approach to growing crystalline films. However, Kyma’s PVDNC process can create perfect nanowires of GaN.


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136  |  Page 137  |  Page 138  |  Page 139  |  Page 140  |  Page 141  |  Page 142  |  Page 143  |  Page 144  |  Page 145  |  Page 146  |  Page 147  |  Page 148  |  Page 149  |  Page 150  |  Page 151  |  Page 152  |  Page 153  |  Page 154  |  Page 155  |  Page 156  |  Page 157  |  Page 158  |  Page 159  |  Page 160  |  Page 161  |  Page 162  |  Page 163  |  Page 164