Page 80
www.us-tech.com Digital Microscope from Keyence
Woodcliff Lake, NJ — Keyence has released its latest microscope system, the VHX-2000, a digital microscope designed to alleviate the shortcomings of traditional, optical light micro- scopes. It overcomes such traditional problems as shallow depth-of-field, short working distance, lack of porta- bility and versatility, and sample limi- tations. By integrating advanced zoom optics with a CCD camera, 17-in. (432mm) LCD monitor, light source, controller and analysis/reporting soft- ware, the VHX streamlines testing and improves the speed and efficiency of the inspection process. With a magnification range
from 0.1x to 5000x, the VHX Series enables a wide range of microscopic observation from macro-scale stereo-
scopic imaging to the detailed analy- sis of an SEM. Many lighting tech- niques are also supported including bright and dark field, transmitted, polarized, and differential interfer- ence observation. Building on top of the VHX plat-
form, the VHX-2000 incorporates sev- eral new features. A color filter wheel has been added to allow users the option of choosing a specific wave- length (red, green or blue) of light for their samples. A Super Resolution mode combines the blue filter with the company’s pixel shift technology, cap- turing images with 25 percent better resolution. To improve ease of use, the instrument can be equipped with a motorized XY stage along with motor- ized Z-axis lens control. Users can
adjust movement in all three axes by using a control pad. When combined
ing function can now be completed with just the push of a button, and at much higher speeds, to produce up to a 20,000 x 20,000 pixel image that expands the viewing area by up to 200 times.
Automated measurement func- Digital microscope system.
with the company’s Double’R lens/ magnification recognition function, the VHX-2000 can automatically pro- vide the ideal movement speed for the XY stage and enables one-push auto- matic focus and calibration. The instrument’s Image Stitch -
tions simplify the most difficult of measurement tasks and help to remove variation between different users. The system also has the abili- ty to save a portion of the image/ measurements as a template to be used to measure future samples with
a click of the mouse. Contact: Keyence Corporation of America, 50 Tice Boulevard,
Woodcliff Lake, NJ 07677 % 888-539-3623 ext 70703 Web:
www.keyence.com
See at Semicon West Booth #6261, 6651.
Build a Better Process…
SPI
With Industry-leading 3D Inspection Solutions from Koh Young America!
Koh Young’s award-winning, patented 3D solder paste inspection technology is the industry’s most powerful process optimization tool. Measurement-based and closed-loop, 3D SPI from Koh Young is critical for building a robust packaging process and preventing costly defects, rework, and delays downstream.
Clacton-on-Sea, UK — Pickering Elec - tronics manufactures a very wide range of mercury-wetted relays, from large high power devices to very small single-in-line types. Mercury-wetted relays remain a good choice for some applications, since they have no con- tact bounce, have a high power rating and offer a very low and stable contact resistance, with over one billion opera- tions. While these devices do not meet the requirements of the RoHS direc- tive, there are many applications that are exempt from this, including med- ical equipment, instrumentation, mili- tary applications, servicing, upgrading
Mercury Wetted Reed Relays from Pickering
July, 2012
or expanding pre-RoHS equipment. One special application involves relays that have two change-over switches with a common open time. These are used in data acquisition systems using the “Flying Capacitor” technique, pro- viding superb isolation between the
source and the device measuring it. Contact: Pickering Interfaces,
12 Alfred St. St., Suite 300-3, Woburn, MA 01801 % 781-897-1710 fax: 781-897-1701 E-mail:
bob.stasonis@
pickeringtest.com Web:
www.pickeringtest.com
See at Semicon West Booth #6080.
AOI
Flawless AOI. No more false calls, escapes, or inspection errors. True 3D AOI makes Zenith the ultimate solution with Z-axis measurement and true comparison with the IPC-A-610 standard. Detect ALL defects; build a better process and a better bottom line!
Koh Young’s goal is to provide the very best inspection technology available globally as the market leader. Partner with the leader; find your process improvement solution today at:
www.kohyoung.com
The Standard in 3D Measurement & Inspection
Koh Young America Inc., tel 480-403-5000 6505 W. Frye Rd., Suite 14, Chandler, AZ 85266 email:
bill.astle@
kohyoung.com
Europe • USA • Korea • Singapore • China • Japan See us at Semicon West / Intersolar, Booth 6481
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88 |
Page 89 |
Page 90 |
Page 91 |
Page 92 |
Page 93 |
Page 94 |
Page 95 |
Page 96 |
Page 97 |
Page 98 |
Page 99 |
Page 100 |
Page 101 |
Page 102 |
Page 103 |
Page 104