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www.us-tech.com


July, 2012


Micro Control Intros Burn-In Test System


Minneapolis, MN — Micro Control Company has released its new HPB- 5C High-Power Burn-In System for high-power devices. The system pro- vides variable airflow control as part


consuming reloads. The burn-in system provides


individual temperature control to each device under test. An active thermal control feature provides pre-


High-power burn-in system.


of the active thermal control of each device under test. This makes it pos- sible for the operator to adjust the speed of the oven blower during sys- tem operation on a device by device basis as required. The HPB-5C also has an


increased vector memory depth over previous Micro Control burn-in sys- tems. A 32M vector memory is now standard with 64M optional. Increased vector memory makes run- ning large numbers of test vectors possible without waiting for time-


cise temperature control for each device under test while supporting a wide range of test strategies. For applications that do not require indi- vidual temperature control, many more devices can be burned in with


test during a burn-in cycle. Contact: Micro Control


Company, 7956 Main Street NE, Minneapolis, MN 55432 % 763-786- 8750 Web: www.microcontrol.com


See at Semicon West Booth #6047.


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