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www.us-tech.com
July, 2011
Sandia & TUV Rheinland to Help US Photovoltaics
Continued from page 1
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itive bids for a third party to certify systems using Sandia technology. After reviewing a number of submis- sions, Sandia awarded the bid to TUV-PTL in May 2009. Sandia spent more than a year verifying the test and analysis methods of TUV-PTL through two rounds of exacting tests and awarded the contract. Traditional tests characterize
PV modules at one temperature, one irradiance and one spectrum, but Sandia’s technology allows users to test PV modules with a highly accu- rate, dual-axis tracker and gather data on multiple weather conditions, temperatures, irradiances, air mass values and angles of incidence. The data are then used to build models that predict how a module might behave in any location. “As the industry and test standards slowly and steadily move away from single- condition to multi-condition testing, the future for this new service looks great and allows us to provide a unique capability to our customers,” said Tamizhmani. Since being awarded the sub- contract, TUV-PTL has successfully
used Sandia’s test methods for sever- al clients to understand various real operating conditions in the field. The technology transfer was
conducted under the Department of Energy Solar Energy Technologies Program PV Test Technology Trans - fer effort. Based in Tempe, Arizona, TUV
Rheinland PTL, LLC is a leading provider of safety and performance testing, and market certification serving every sector of the photo- voltaic and solar thermal market- place, from the supply chain through installation. TUV Rheinland PTL is a member of the TUV Rheinland Group, which has the largest net- work of solar energy laboratories worldwide, with six major laborato- ries on three continents. he lab was formed as a unique
partnership between Arizona State University, an institution with more than 50 years of research on solar energy and extensive solar testing know-how, and TUV Rheinland, a $1.5 billion global provider of inde- pendent testing, assessment, and certification services. For info:
www.tuvptl.com r
NIST & AIP Semiconductor
Research Available Online Continued from page 1
to speed on unfamiliar measurement and characterization issues. In addi- tion, they can learn about new tech- niques and equipment being intro- duced to characterize semiconduc- tors.
“These collected proceedings
represent research and overviews of critical topics collected from world- wide experts in the field of semicon- ductor characterization and metrolo- gy,” says Seiler. “As there is frequent turnover in the industry, there is constant need for training and
retraining of employees. Improved access to this background will ease that process dramatically.” On the NIST Web site, the
archived proceedings publications, up to and including the 2009 confer- ence (along with slides from most of the conference invited talks), are available at
www.nist.gov/pml/semi- conductor/conference/
archives.cfm. The AIP has made the archived pro- ceedings publications available at
http://proceedings.aip.org/semicon- ductor_metrology. Documents are available in searchable PDF form. r
cOnTenTs
Tech-Op-Ed ........................... 4 Tech Watch............................. 10 People................................. 12 Business News..................... 14 Business Briefs.................... 15 Management........................ 16 EMS .................................... 18 Electronic Mfg. Prods...... 22 Production.......................... 44 Partnering........................... 46 Distribution........................ 48 New Products..................... 72 High-Tech Events............. 84 Editorial Calendar............... 84 Advertisers Index............... 86
Special Focus: SMT and Production........... 50
Product Preview: Semicon and Intersolar ........ 60
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