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July, 2019


www.us- tech.com


Seica: Flying Probe Testers to Meet Diverse Market Needs


Continued from previous page


in this configuration. CAD Data and Software The physical size of these probe


and interface cards can be quite large, and their CAD data and component counts can be extensive. With very large CAD files and component counts exceeding 10,000 parts, the flying probe provider needs to have the lat- est personal computers and robust, upfront, easy-to-use CAD processing software. When processing any probe card files, it is generally a necessity to have the latest computing hardware and software to even start Seica’s pro- gram generation.


High-Resolution Testing Seica then focused its attention


on the high-resolution requirements to test standard probe cards and mul- tilayer organic (MLO) probe cards after developing the proper mechani- cal and software architecture. The company introduced even


more capable 10 MP cameras to be able to probe down to well under 2 mil (51 µm) pads. Specially designed probe pins leave no witness marks on the PCBs or scuff marks on the sub- strates. Not only are these special- ized tools used to test probe cards, but also interposers and the very del- icate and precise gold and precious


Seica has integrated an environmental unit in the


test area that floods it and the UUT with a tempera-


ture range from 32 to 158°F (0 to 70°C). This helps the OEM customer be assured that its product is meeting specifications.


metal regions on the most complex and expensive semiconductor boards. The Pilot Next> series testers


can be augmented with unique pin types for testing both sub-2 mil (51 µm) pads on one side of the UUT (probe card) and using alternate pin needle types on the opposite side.


High-Frequency Testing Next, Seica moved in the direc-


tion of “high-frequency” testing and environmental product validation. The company has developed probe pins that allow testing up to 5 GHz. Seica developed its Pilot V8 HF Next> system, with its sights set on the new market of the Internet of Things (IoT), advances in cellular devices, the expanding 5G market, and the nearly unlimited demand for more cellular bandwidth. This allows for a single invest-


ment in a Pilot V8 Next> series machine that can be fitted with pro- prietary HF probes, allowing cus- tomers to test products and also vali- date them. Product validation is to “prove out” the capability of the OEMs end product before they initi- ate NPI or full scale production. Along the same lines for product


validation, Seica has integrated an environmental unit in the test area that floods it and the UUT with a temperature range from 32 to 158°F (0 to 70°C). This can be very helpful in giving OEM customers confidence


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that their product is meeting specifi- cations using a quick method to test and diagnose the product in environ- mental conditions, without the need for ovens and other chambers. This simultaneously allows the


test engineer to probe the board under the established environment. Semiconductor probe cards and even backplane network boards may need to be tested several times during the production process. Failure analysis by customers has determined that for critical signals and certain nets, board impedances have varied, due to different customer manufacturing


processes. As a result, customers want to


exercise the UUT under certain envi- ronmental constraints to see if the signal integrity has been altered. In other scenarios, the customer would like to test the UUT in its bareboard, “unloaded” component state, check- ing nets, as well as opens and shorts, then send the board to the assembly phase where components are installed. Then the UUT is returned to the same test system to measure the same specified and critical signal nets for comparison. These techniques and processes


are not standard, and in most case, require unique probe pins for loaded board testing, pins for substrate and wafer probing, and software algo- rithms that have been specifically designed for these purposes. The Pilot V8 HF Next> tester includes all these features as standard for this very specialized market segment. Contact: Seica, Inc., 110 Avco


Road, Haverhill, MA 01835 % 603-890-6002 E-mail: davidsigillo@seicausa.com Web: www.seica-na.com r


See at SEMICON West, Booth 1865


Page 79


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See at SEMICON West, Booth 5369


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