Heather Hobbs MICROSCOPYNEWS Anasys Instruments Receives Innovation Award
Anasys Instruments’ CEO Roshan Shetty was presented with a Microscopy Today 2011 Innovation Award for the company’s AFM-IR platform during the 2011 M&M Annual conference held this year in Nashville,TN. The AFM-IR technique, developed by Dr Alexandre Dazzi at the University of Paris-Sud, uses an AFM probe as the IR absorbance detector and hence obtains IR spectroscopy at up to 2 orders of magnitude better than traditional IR spectroscopy. It also provides the AFM with true chemical ID capability, said the company.
Commenting on the impact of AFM-IR which led to the award, internationally-recognised spectroscopist, Dr Curtis Marcott, Senior Partner at Light Light Solutions and the 2011 President of the Society for Applied Spectroscopy, said: “the combination of atomic force microscopy (AFM) and infrared (IR) spectroscopy as manifested in the new technique of AFM-IR is one of the most important recent developments in the important field of IR microspectroscopy and chemical imaging. The importance of IR spectroscopy to our scientific infrastructure needs no introduction given the size of the industry and the breadth of its application. However, the fundamental physical limit imposed by diffraction has prevented the use of this important technology to applications requiring high spatial resolution which is the case for many of the exciting new issues in polymers and the life sciences.”
nasys AFM-IR Innovation Award winner TO FIND OUT MORE CIRCLE NO. True Surface Microscopy wins Microscopy Accolade
WITec has just received the prestigious Microscopy Today Innovation Award for the development of True Surface Microscopy. Each year, Microscopy Today magazine selects the best new development in microscopy and presents the award at the US Microscopy and Microanalysis Exhibition and Conference which this year took place in Nashville, TN. True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Previously, True Surface Microscopy received the PITTCON 2011 Editors Gold Award and the R&D 100 Award.
“We’re almost at a loss for words, as the Microscopy Today Innovation Award is the third honor in the past few months for this technology” said Dr. Joachim Koenen, Managing Director of WITec. “The continuing public recognition of our innovative spirit underlines the potential of True Surface Microscopy for a wide range of surface science applications.”
WITec US Managing Director Bob Hirche receives the Microscopy Today Innovation Award 2011 from Microscopy Today Editor in Chief Charles Lyman. TO FIND OUT MORE CIRCLE NO.
SALVE Project Enters Second Phase
Following the successful completion of a two-year evaluation phase, the University of Ulm, the Heidelberg- based company CEOS GmbH and Carl Zeiss Nano Technology Systems have signed an agreement to embark on the next phase of the SALVE project. SALVE – which stands for Sub-Angstrom Low Voltage Electron Microscope – is one of the most ambitious research projects in the field of electron microscopy to be undertaken in Germany in recent years.
The objective of the project is to develop and build a transmission electron microscope capable of imaging samples with atomic resolution at very low acceleration voltages. The researchers are also aiming to develop suitable sample preparation methods. The advantages offered by this approach are clear: Unlike the current generation of medium-voltage TEMs with accelerating voltages of between 200 and 300kV, which destroy radiation-sensitive samples before researchers can record usable images or perform material analysis, the SALVE project will keep specimens stable long enough to perform experimental work.
Implementation of this tantalising concept was previously seen as impossible due to the physical and technical hurdles that stood in the way of achieving the required resolution, because lower accelerating voltages lead to significant optical aberrations.
TO FIND OUT MORE CIRCLE NO. 214 ‘Microcanyon’ Captures Grand Prize
FEI is proud to announce that Martina Dienstleder of the Institute for Electron Microscopy at the Graz University of Technology has been awarded the grand prize in the 2011 FEI Owner Image Contest for her entry ‘Microcanyon’. The image was selected by FEI experts from the three monthly finalists, including ‘Alveoli’ by Oliver Meckes and ‘Lamnacarus Ornatus’ by Angelika Reichmann. Overall, the entries were judged on their aesthetic appeal, application and scientific relevance, and overall creativity. Martina's entry shows a micro-crack in steel after bending tests, and the resulting image inspired her to colorise the micrograph, creating an amazing likeness of a canyon. The image was coloured by colleague Manuel Paller.
212 211
Instrument used: Nova DualBeam family.
Grand prize winner Martina Dienstleder with Manuel Paller
TO FIND OUT MORE CIRCLE NO. SPM Meeting - Berlin
JPK Instruments are happy to announce that registration is now open for the tenth annual international symposium on the applications of scanning probe microscopy (SPM) and optical tweezers. The symposia will be held on the 5-6th October 2011 in Berlin focusing on applications developments in life sciences. These meetings continue to be highly regarded on the international life sciences meetings calendar. More than 100 scientists from around the world are expected to come to Berlin to discuss their results and share scientific knowledge in a relaxed and informal atmosphere.
Send us your Microscopy News...
Email:
heather@intlabmate.com
This year's speakers come from Europe and China and will present new research results on a wide variety of topics. These will range from single molecule force spectroscopy to torsional tapping AFM. A new method for cancer detection by probing the elastic properties of cells is one of the many applications. In the optical tweezers part of the program, contributions include the study of mucin self-interactions and how the cell-cell adhesion of enthrocytes may be studied using both optical tweezers and AFM. The meeting will also feature poster sessions where delegates are invited to showcase their work to their peers helping to make it a most interactive scientific meeting. These traditionally attract a high standard of work offering students the opportunity to present posters alongside leading researchers.
JPK Workshop meeting
Announcing this year's meeting, Torsten Jähnke, Chief Technical Officer of JPK, said: "the speaker list is top notch again. It is rewarding after the hard work putting together the event to have such a good list of top people as speakers. I am looking forward to the popular poster competitions and see the latest research activities of our delegates."
To learn more or to attend this meeting, visit the NanoBioVIEWS™ web site,
www.nanobioviews.net TO FIND OUT MORE CIRCLE NO.
215 213
TO BE INCLUDED IN OUR NEXT ISSUE, SEND ALL YOUR MICROSCOPY NEWS STORIES TO
HEATHER@INTLABMATE.COM
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68
