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Agilent’s New Signal Analyzer is Multitasking
The new options for the firm’s X-Series deliver wider bandwidth, faster speed and more measurement capabilities.
Agilent has announced new options for the X-Series signal analyzers designed to deliver wider bandwidth, faster measurement speed and more measurement capabilities.
The options specifically address the needs of today’s wireless R&D and manufacturing engineers performing wideband signal demodulation analysis by providing quicker insight into signal analysis and faster, more cost-effective component characterization.
Agilent will demonstrate the new options, along with other products and services for wireless communication; radar; RF technologies; high- frequency semiconductors; electromagnetic; commercial and military RF; microwave; and mm- wave electronics and applications, at the European Microwave Week 2010, Sept. 26 - Oct. 1, Paris, CNIT La Défense, Booth #62/46.
“Today’s wireless and consumer electronics industries are facing wider bandwidth requirements to support the higher data rates needed for transmission of downloads, video and data in smartphones and other applications,” said Jim Curran, marketing manager of Agilent’s Microwave and Communications Division. “With the new options, the X-Series signal analyzers continue to deliver unmatched measurement power and versatility.”
A new 40-MHz analysis bandwidth option for the Agilent MXA and EXA signal analyzers delivers wideband signal analysis and measurement capabilities. These capabilities include 40 MHz bandwidth CCDF measurement; burst power measurement; QPSK EVM measurement; IQ waveform measurement; 802.16e OFDM modulation analysis; and other complex digital modulation analysis.
A new 25-MHz bandwidth option for the CXA signal analyzer specifically addresses the wideband signal analysis requirement in low cost R&D and consumer electronics manufacturing. For test environments requiring even wider bandwidth, the highest performance Agilent PXA signal analyzer offers up to 140 MHz of bandwidth.
A new digital IF (DIF) design feature in the MXA and EXA signal analyzers expands analysis bandwidth to 40 MHz. It also adds an enhanced digital processor with deeper capture memory, up to 2 GB, and real-time error correction to accelerate IQ acquisition.
The faster measurement speed ensures engineers have the speed their measurement tasks demand, as well as the flexibility to choose the X-Series analyzer that provides the best balance of cost and performance.
The X-Series signal analyzers now offer the following two additional capabilities for device under test (DUT) stimulus-response measurements:
* An external source control capability on the CXA/EXA/MXA signal analyzer that supports the Agilent MXG N5181A/N5182A signal generator. This support enables the most flexible stimulus- response measurements of components or devices by leveraging the powerful functionality of the MXG signal generators.
* A built-in tracking generator (up to 6 GHz) on the October 2010
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