news digest ♦ compound semiconductor ♦ product news
modulation and calibration technologies allows the display to meet these demanding requirements.
Accel-RF Unveils “Smart Fixture” Product Line for Characterization of RF Devices
The new series can characterize numerous compound semiconductor performance metrics such as intrinsic reliability, performance degradation and can be used for parameter variation analysis.
Dolby’s PRM 4200 monitor – brilliant colors with OSRAM Ceramos MultiLED.
Conventional backlit monitors with CCFL backlighting (cold cathode fluorescent lamps) struggle to provide deep blacks, end up displaying dark grey instead and are limited in color gamut. The LEDs Dolby uses are Ceramos MultiLED devices from Osram Opto.
They deliver the high performance required by the professional content creation industry. The red, green and blue chips of the LED are positioned so the color mix has the same appearance when observed from a wide range of angles. The 0.9mm high and 3x4.5mm size package is ideal for flat backlights and its ceramics material makes it extremely stable over a long period of time. These LEDs have lifetimes in excess of 50,000 hours.
“We are pleased to work with Dolby and provide them with high performance LEDs that can meet the needs of their demanding applications. The trend towards LEDs for use in display applications is clear and our analysis also shows that more than 50% of consumer TV sets will be equipped with LED backlighting in 1-2 years,” said Winfried Schwedler, Marketing Manager at OSRAM Opto Semiconductors.
Accel-RF, a worldwide provider of turn-key RF reliability and performance characterization test systems has revealed the addition of a new “Smart Fixture”product-line for performance characterization of compound semiconductor devices.
This USB controlled fixture, complete with either custom matching circuits, or proprietary wide bandwidth bias-tees, includes an embedded heater, and integrated analog/digital control board for temperature setting and DC/RF pulsing setup.
The fixture has an innovative clamping system that will allow for electrical, mechanical, and RF contact of the device-under-test without “hard-mounting” of the package and leads. The configuration is capable of use with several different thermal imaging systems, including micro-raman spectroscopy, for channel-temperature measurement under active bias, temperature, and RF stimulation.
“The smart fixture from Accel-RF allows our customers to manage the stimulus to their RF device on a bench-top setting to control the base- plate or channel-temperature, DC bias, and RF signal to specific test conditions. This opens an avenue to quickly characterize device performance on numerous levels. These performance metrics can be for intrinsic reliability studies, performance degradation studies, or for parameter variation analysis” says Roland Shaw, President and co- founder of Accel-RF.
“This off-the-shelf solution provides a standard fixture with the capability to adapt to as many as 11 different package types and allowing our customer to get on with the task of testing the device without the issue of developing a new fixture for each application”, adds Shaw.
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www.compoundsemiconductor.net October 2010
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